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Volumn , Issue , 2003, Pages 547-555

Crystal oscillators' jitter measurements and its estimation of phase noise

Author keywords

[No Author keywords available]

Indexed keywords

BANDWIDTH; FUNCTIONS; JITTER; MATHEMATICAL MODELS; SPURIOUS SIGNAL NOISE; TIME DOMAIN ANALYSIS;

EID: 1542376140     PISSN: 01616404     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (22)

References (22)
  • 2
    • 0000969429 scopus 로고
    • Characterization of Clocks and Oscillators
    • U.S Department of Commerce, National Institute of Standards and Technology, March
    • D.B Sullivan, D.W Allan, D.A. Howe and F.L. Walls, "Characterization of Clocks and Oscillators", NIST Technical Note 1337, U.S Department of Commerce, National Institute of Standards and Technology, March 1990.
    • (1990) NIST Technical Note 1337
    • Sullivan, D.B.1    Allan, D.W.2    Howe, D.A.3    Walls, F.L.4
  • 3
    • 0022187962 scopus 로고
    • Frequency and Time - Their Measurement and Characterization
    • Chapter 12, Edited by E.A. Gerber and A. Ballato, Academic Press, New York
    • S.R. Stein, "Frequency and Time - Their Measurement and Characterization", Chapter 12, pp. 191-416, Precision Frequency Control, Vol. 2, Edited by E.A. Gerber and A. Ballato, Academic Press, New York, 1985.
    • (1985) Precision Frequency Control , vol.2 , pp. 191-416
    • Stein, S.R.1
  • 5
    • 0035170693 scopus 로고    scopus 로고
    • Computation of Time-domain Frequency Stability and Jitter from PM Noise Measurements
    • W.F. Walls and F.L. Walls, "Computation of Time-domain Frequency Stability and Jitter from PM Noise Measurements", Proc. 2001 IEEE Int. Freq. Cont. Symp., 161-166.
    • Proc. 2001 IEEE Int. Freq. Cont. Symp. , pp. 161-166
    • Walls, W.F.1    Walls, F.L.2
  • 7
    • 1542263323 scopus 로고
    • The fluctuations in oscillators systems
    • M. Nauka, in Russian
    • A. Malahov, "The fluctuations in oscillators systems" M. Nauka, Glavn. Red. Phys.-Math. Lit., 1968, 661 p. (in Russian).
    • (1968) Glavn. Red. Phys.-math. Lit.
    • Malahov, A.1
  • 8
    • 1542263322 scopus 로고
    • Noise and jitter influence on pulses parameters measurements
    • in Russian
    • B. Gudkovich, I. Zamek. "Noise and jitter influence on pulses parameters measurements". Tech. Sredstv Svyazi. Radioizmerit. Tech., No. 5, 1976. (in Russian).
    • (1976) Tech. Sredstv Svyazi. Radioizmerit. Tech. , vol.5
    • Gudkovich, B.1    Zamek, I.2
  • 9
    • 1542353262 scopus 로고
    • The investigation of the jitter presence in sampling oscilloscopes and pulse generators
    • in Russian
    • B. Gudkovich, I. Zamek. "The investigation of the jitter presence in sampling oscilloscopes and pulse generators". Tech. Sredstv Svyazi. Radioizmerit. Tech., No. 5, 1977. (in Russian).
    • (1977) Tech. Sredstv Svyazi. Radioizmerit. Tech. , vol.5
    • Gudkovich, B.1    Zamek, I.2
  • 11
    • 1542263320 scopus 로고
    • The signals and noises transformation in sampling oscilloscopes
    • in Russian
    • I. Zamek. "The signals and noises transformation in sampling oscilloscopes". Tech. Sredstv Svyazi. Radioizmerit. Tech., No. 1, 1981. (in Russian).
    • (1981) Tech. Sredstv Svyazi. Radioizmerit. Tech. , vol.1
    • Zamek, I.1
  • 12
    • 1542263319 scopus 로고    scopus 로고
    • Phase jitter - Phase noise and voltage controlled crystal oscillators
    • Corning Frequency Control Inc.
    • D. Chandler, "Phase jitter - phase noise and voltage controlled crystal oscillators", Corning frequency control Inc. Technical Note.
    • Technical Note
    • Chandler, D.1
  • 14
    • 0031165398 scopus 로고    scopus 로고
    • Jitter in ring oscillators
    • June
    • J. McNeill, "Jitter in ring oscillators", IEEE J. Solid-State Circuits, vol. 32, 870-879, June 1997.
    • (1997) IEEE J. Solid-state Circuits , vol.32 , pp. 870-879
    • McNeill, J.1
  • 17
    • 0035687404 scopus 로고    scopus 로고
    • An approach to consistent jitter modeling for various jitter aspects and measurement methods
    • M. Shimanouchi, "An approach to consistent jitter modeling for various jitter aspects and measurement methods", Proceedings of the 2001 International Test Conference, pp. 848-857.
    • Proceedings of the 2001 International Test Conference , pp. 848-857
    • Shimanouchi, M.1
  • 18
    • 0141779607 scopus 로고    scopus 로고
    • Agilent EEsof EDA, Agilent Technologies Inc.
    • R. Poore "Phase noise and jitter", Agilent EEsof EDA, Agilent Technologies Inc., 2001.
    • (2001) Phase Noise and Jitter
    • Poore, R.1
  • 19
    • 24044451606 scopus 로고    scopus 로고
    • Calculate oscillator jitter by using phase-noise analysis
    • January; Part 2, February 2001
    • B. Drakhlis, "Calculate oscillator jitter by using phase-noise analysis", MICROVAVE & RF, Parti, January 2001; Part 2, February 2001.
    • (2001) Microvave & RF, Part1
    • Drakhlis, B.1
  • 20
    • 1542263321 scopus 로고    scopus 로고
    • Clock Jitter estimation from PM Noise Measurements
    • April
    • D.A. Howe, "Clock Jitter estimation from PM Noise Measurements", Proc. MTT-ARFTG Conf., April, 2002.
    • (2002) Proc. MTT-ARFTG Conf.
    • Howe, D.A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.