-
1
-
-
0039137613
-
-
Schmid, G.; Baumle, M.; Geerkens, M.; Helm, I.; Osemann, C.; Sawitowski, T. Chem. Soc. Rev. 1999, 3, 179-185.
-
(1999)
Chem. Soc. Rev.
, vol.3
, pp. 179-185
-
-
Schmid, G.1
Baumle, M.2
Geerkens, M.3
Helm, I.4
Osemann, C.5
Sawitowski, T.6
-
2
-
-
0003071512
-
-
Rao, C. N. R.; U.Kulkarni, G.; Thomas, P. J.; Edwards, P. P. Chem. Soc. Rev. 2000, 1, 27-35.
-
(2000)
Chem. Soc. Rev.
, vol.1
, pp. 27-35
-
-
Rao, C.N.R.1
Kulkarni, U.G.2
Thomas, P.J.3
Edwards, P.P.4
-
3
-
-
0034692347
-
-
Reynolds, C. H.; Annan, N.; Beshah, K.; Huber, J. H.; Shaber, S. H.; Lenkinski, R. E.; Wortman, J. A. J. Am. Chem. Soc. 2000, 122, 8940-8945.
-
(2000)
J. Am. Chem. Soc.
, vol.122
, pp. 8940-8945
-
-
Reynolds, C.H.1
Annan, N.2
Beshah, K.3
Huber, J.H.4
Shaber, S.H.5
Lenkinski, R.E.6
Wortman, J.A.7
-
5
-
-
0038653186
-
-
Guo, L.; Yang, S.; Yang, C.; Yu, P.; Wang, J.; Ge, W.; Wong, G. K. L. Appl. Phys. Lett. 2000, 76, 2901-2903.
-
(2000)
Appl. Phys. Lett.
, vol.76
, pp. 2901-2903
-
-
Guo, L.1
Yang, S.2
Yang, C.3
Yu, P.4
Wang, J.5
Ge, W.6
Wong, G.K.L.7
-
6
-
-
0033553826
-
-
Wang, R.; Zheng, Z.; Jin, T.; Staples, R. J. Angew. Chem., Int. Ed. 1999, 38, 1813-1815.
-
(1999)
Angew. Chem., Int. Ed.
, vol.38
, pp. 1813-1815
-
-
Wang, R.1
Zheng, Z.2
Jin, T.3
Staples, R.J.4
-
7
-
-
0033798279
-
-
Guo, L.; Yang, S.; Yang, C.; Yu, P.; Wang, J.; Ge, W.; Wong, G. K. L. Chem. Mater. 2000, 12, 2268-2274.
-
(2000)
Chem. Mater.
, vol.12
, pp. 2268-2274
-
-
Guo, L.1
Yang, S.2
Yang, C.3
Yu, P.4
Wang, J.5
Ge, W.6
Wong, G.K.L.7
-
9
-
-
0033363494
-
-
Caravan, P.; Ellison, J. J.; McMurry, T. J.; Lauffer, R. B. Chem. Rev. 1999, 99, 2293-2352.
-
(1999)
Chem. Rev.
, vol.99
, pp. 2293-2352
-
-
Caravan, P.1
Ellison, J.J.2
McMurry, T.J.3
Lauffer, R.B.4
-
10
-
-
0037185045
-
-
Wang, R.; Selby, H. D.; Liu, H.; Carducci, M. D.; Jin, T.; Zheng, Z.; Anthis, J. W.; Staples, R. J. Inorg. Chem. 2002, 41, 278-286.
-
(2002)
Inorg. Chem.
, vol.41
, pp. 278-286
-
-
Wang, R.1
Selby, H.D.2
Liu, H.3
Carducci, M.D.4
Jin, T.5
Zheng, Z.6
Anthis, J.W.7
Staples, R.J.8
-
11
-
-
0039598715
-
-
Bürgstein, M. R.; Roesky, P. W. Angew. Chem., Int. Ed. 2000, 39, 549-551.
-
(2000)
Angew. Chem., Int. Ed.
, vol.39
, pp. 549-551
-
-
Bürgstein, M.R.1
Roesky, P.W.2
-
12
-
-
0000999443
-
-
Anwander, R.; Munck, F. C.; Priermeier, T.; Scherer, W.; Runte, O.; Herrmann, W. A. Inorg. Chem. 1997, 36, 3545-3552.
-
(1997)
Inorg. Chem.
, vol.36
, pp. 3545-3552
-
-
Anwander, R.1
Munck, F.C.2
Priermeier, T.3
Scherer, W.4
Runte, O.5
Herrmann, W.A.6
-
13
-
-
0034596927
-
-
Du, B.; Meyers, E. A.; Shore, S. G. Inorg. Chem. 2000, 39, 4639-4645.
-
(2000)
Inorg. Chem.
, vol.39
, pp. 4639-4645
-
-
Du, B.1
Meyers, E.A.2
Shore, S.G.3
-
16
-
-
17344383662
-
-
and references therein
-
Grillone, M. D.; Addamo, M.; Volpe, M. J. Alloys Compd. 2001, 323-324, 61-65 and references therein.
-
(2001)
Alloys Compd.
, vol.323-324
, pp. 61-65
-
-
Grillone, M.D.1
Addamo, M.2
Volpe, M.J.3
-
17
-
-
0000032019
-
-
Dubè, T.; Gambarotta, S.; Yap, G. Organometallics 1998, 17, 3967-3973.
-
(1998)
Organometallics
, vol.17
, pp. 3967-3973
-
-
Dubè, T.1
Gambarotta, S.2
Yap, G.3
-
18
-
-
1542369845
-
-
note
-
2 using the SHELXTL/PC package (Siemens SHELXTLplus Version 5.1 (Windows NT version) Structure Determination Package; Siemens Analytical X-ray Instruments Inc.: Madison, WI, 1998). R = 0.0565 (on 15894 reflections with I > 2σ(I), 1123 parameters), wR2 (all data) = 0.1467; GOF = 1.02; maximum electron density = 1.05.
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-
-
-
19
-
-
0003388736
-
-
Petersen, J. L.; Brown, R. K.; Williams, J. M. Inorg. Chem. 1981, 20, 158-165.
-
(1981)
Inorg. Chem.
, vol.20
, pp. 158-165
-
-
Petersen, J.L.1
Brown, R.K.2
Williams, J.M.3
-
20
-
-
0039497233
-
-
Grillone, M. D.; Benetollo, F.; Bombieri, G.; Del Pra, A. J. Organomet. Chem. 1999, 575, 193-199.
-
(1999)
J. Organomet. Chem.
, vol.575
, pp. 193-199
-
-
Grillone, M.D.1
Benetollo, F.2
Bombieri, G.3
Del Pra, A.4
-
22
-
-
1542279957
-
-
note
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52: Sm 38.73, Cr 2.97, C 30.93, H 3.55, CO 8.01. Found: Sm 38.55, Cr 2.93, C 29.91, H 3.04, CO 7.97.
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