Scanning Fluorescent Microthermal Imaging

Conference Proceedings from the International Symposium for Testing and Failure Analysis

Volumn 1997-October, Issue , 1997, Pages 41-49

  Barton, Daniel L ^a   Tangyunyong, P ^a  

^a SANDIA NATIONAL LABORATORIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CCD CAMERAS; FAILURE ANALYSIS; FLUORESCENCE IMAGING; IMAGE RESOLUTION;

ANALYSIS TECHNIQUES; FLUORESCENT MICROTHERMAL IMAGING; HIGH SPATIAL RESOLUTION; LASER MICROSCOPES; LASER SOURCES; POINT DETECTORS; PUMP SOURCES; SCANNING LASERS; SLOW SCAN CCD CAMERA; THERMAL RESOLUTION;

SCANNING;

EID: 1542314010     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.31399/asm.cp.istfa1997p0041     Document Type: Conference Paper

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