Fluorescent microthermal imaging - Theory and methodology for achieving high thermal resolution images

Microelectronic Engineering

Volumn 31, Issue 1-4, 1996, Pages 271-279

  Barton, D L ^a   Tangyunyong, P ^a  

^a SANDIA NATIONAL LABORATORIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFRACTION; ELECTRON ENERGY LEVELS; ENERGY ABSORPTION; ENERGY TRANSFER; FLUORESCENCE; IMAGE QUALITY; INORGANIC COATINGS; SHOT NOISE; SIGNAL TO NOISE RATIO; SURFACES; THIN FILMS; ULTRAVIOLET RADIATION;

FLUORESCENT MICROTHERMAL IMAGING; INCIDENT RADIATION; PHOTON SHOT NOISE; THERMAL SENSITIVITY; ULTRAVIOLET BLEACHING; WAVELENGTHS;

INFRARED IMAGING;

EID: 0030087168     PISSN: 01679317     EISSN: None     Source Type: Journal    
DOI: 10.1016/0167-9317(95)00349-5     Document Type: Article

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