SRAM Failure Analysis Flow

Conference Proceedings from the International Symposium for Testing and Failure Analysis

Volumn , Issue , 2001, Pages 323-329

  Brillert, Christof ^a   Burmer, Christian ^a   Egger, Peter ^a  

^a INFINEON TECHNOLOGIES AG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC POTENTIAL; FAILURE ANALYSIS; FLIP FLOP CIRCUITS; IMAGE ANALYSIS; ION BEAMS; PROBES; SCANNING ELECTRON MICROSCOPY; TRANSISTORS;

ELECTRICAL ANALYSIS; GATE OXIDE DEFECTS (GOX);

STATIC RANDOM ACCESS STORAGE;

EID: 1542300673     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (3)

1. th ISTFA 2000, Bellevue, Washington, pp. 129-135 (2000)
2. th IPFA 2001, Singapore, pp. 165-168 (2001)
3. A.J. van de Goor, Testing semiconductor memories: theory and practice, ComTex Publishing, Gouda, Netherlands (1998)