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Volumn 2, Issue 1, 2003, Pages 698-703

Combined Differential and Relative Pressure Sensor based on a Double-Bridged Structure

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; APPROXIMATION THEORY; CALIBRATION; COMPUTER SIMULATION; ERROR ANALYSIS; ETCHING; FINITE ELEMENT METHOD; MICROELECTROMECHANICAL DEVICES; RESISTORS; STRESS ANALYSIS;

EID: 1542273518     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (5)

References (8)
  • 1
    • 0026881945 scopus 로고
    • Temperature compensation of piezoresistive pressure sensors
    • M. Akbar and M. A. Shanblatt, Temperature compensation of piezoresistive pressure sensors, Sensors and Actuators A, 33 (1992), p. 155
    • (1992) Sensors and Actuators A , vol.33 , pp. 155
    • Akbar, M.1    Shanblatt, M.A.2
  • 3
    • 0029510971 scopus 로고
    • Compensation method of offset and its temperature drift in silicon piezoresistive pressure sensor using double Wheatstone-bridge configuration
    • Young-Tae Lee and Hee-Don Seo, Compensation method of offset and its temperature drift in silicon piezoresistive pressure sensor using double Wheatstone-bridge configuration, Proc. of Transducers'95, Vol.2, 1995, p. 570
    • (1995) Proc. of Transducers'95 , vol.2 , pp. 570
    • Lee, Y.-T.1    Seo, H.-D.2
  • 4
    • 1542268804 scopus 로고    scopus 로고
    • Grundfos. Pressure sensor or differential pressure sensor. Patent EP00801293B1
    • Grundfos. Pressure sensor or differential pressure sensor. Patent EP00801293B1.
  • 6
    • 0032687815 scopus 로고    scopus 로고
    • Tantalum oxide thin films as protective coating for sensors
    • USA
    • C. Christensen, R. de Reus and S. Bouwstra, Tantalum oxide thin films as protective coating for sensors, MEMS'99, USA, 1999, p. 267
    • (1999) MEMS'99 , pp. 267
    • Christensen, C.1    De Reus, R.2    Bouwstra, S.3
  • 8
    • 1542328715 scopus 로고
    • Properties of silicon
    • ISBN: 0852964757
    • "Properties of silicon", Inspec., ISBN: 0852964757, 1988, p. 3
    • (1988) Inspec. , pp. 3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.