A Comparison of Layered Metal-Semiconductor Optical Position Sensitive Detectors

Proceedings of IEEE Sensors

Volumn 1, Issue 2, 2002, Pages 836-840

  Henry, J ^a   Livingstone, J ^a  

^a UNIVERSITY OF WESTERN AUSTRALIA   (Australia)

Author keywords

Optical position detectors

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; DEPOSITION; ELECTRIC RESISTANCE; ELECTRON BEAMS; FILM GROWTH; OPTICAL FILMS; PHOTOVOLTAIC EFFECTS; SCHOTTKY BARRIER DIODES; SEMICONDUCTOR JUNCTIONS; TANTALUM; THICKNESS MEASUREMENT;

FILM TRANSMISSIVITY; OPTICAL POSITION DETECTORS;

POSITION MEASUREMENT;

EID: 1542271486     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)

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4. Ohring, M., The Materials Science of Thin Films, Academic Press, New York, (1992).
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