Samarium-induced surface reconstructions of Si(0 0 1)

Surface Science

Volumn 579, Issue 2-3, 2005, Pages 157-165

  Ohbuchi, C ^a   Nogami, J ^b,c  

^a MICHIGAN STATE UNIVERSITY   (United States)

^b Michigan State University   (United States)

^c UNIVERSITY OF TORONTO   (Canada)

Author keywords

Samarium; Scanning tunneling microscopy; Silicide; Silicon; Surface relaxation and reconstruction; Surface structure, morphology, roughness, and topography

Indexed keywords

DEPOSITION; MONOLAYERS; MORPHOLOGY; PHOTOEMISSION; SAMARIUM; SCANNING TUNNELING MICROSCOPY; STRUCTURE (COMPOSITION); SURFACE ROUGHNESS; SURFACE TREATMENT;

SILICIDE; SURFACE RELAXATION AND RECONSTRUCTION; TOPOGRAPHY; ZIGZAG CHAIN STRUCTURES;

SILICON;

EID: 14944378096     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2005.01.041     Document Type: Article

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