Phase stabilities of ternary rare earth metal disilicides

Applied Physics A: Materials Science and Processing

Volumn 78, Issue 1, 2004, Pages 1-3

  Huang, M L ^a   Yang, J H ^a   Chang, Y A ^a   Ragan, R ^b   Chen, Y ^b   Ohlberg, D A A ^b   Williams, R S ^b  

^a Wisconsin Electric Machines and Power Electronics Consortium   (United States)

^b HEWLETT PACKARD LABORATORIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; COMPOSITION; CRYSTAL DEFECTS; CRYSTAL GROWTH; ERBIUM COMPOUNDS; LATTICE CONSTANTS; NANOSTRUCTURED MATERIALS; PHASE TRANSITIONS; SELF ASSEMBLY; TERNARY SYSTEMS; X RAY DIFFRACTION ANALYSIS;

LATTICE MISMATCHES; NANOWIRES;

SILICON COMPOUNDS;

EID: 0742301689     PISSN: 09478396     EISSN: None     Source Type: Journal    
DOI: 10.1007/s00339-003-2258-6     Document Type: Article

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