SCOPUS 정보 검색 플랫폼

Journal of Magnetism and Magnetic Materials

Volumn 290-291 PART 2, Issue , 2005, Pages 1539-1542

Variation of structure and magnetic properties with thickness of thin Co59Fe26Ni15 films

(4) Chechenin, N G a Du Marchie Van Voorthuysen, E H b De Hosson, J Th M b Boerma, D O c

a MOSCOW STATE UNIVERSITY (Russian Federation)

b UNIVERSITY OF GRONINGEN (Netherlands)

c CENTRO DE MICROANÁLISIS DE MATERIALES (Spain)

Author keywords

Anisotropy; Co Fe Ni; Coercivity; Microstructure; Nanocrystalline thin films; Phase composition; Soft magnetic materials; Thin films thickness

Indexed keywords

COBALT ALLOYS; COERCIVE FORCE; DATA REDUCTION; ELECTRODEPOSITION; GIANT MAGNETORESISTANCE; IRON ALLOYS; MAGNETIC ANISOTROPY; MAGNETIC FIELDS; MAGNETIC HEADS; MICROSTRUCTURE; NANOSTRUCTURED MATERIALS; NICKEL ALLOYS; PHASE COMPOSITION; SOFT MAGNETIC MATERIALS; X RAY DIFFRACTION ANALYSIS;

CO-FE-NI; FILM SURFACE; NANOCRYSTALLINE THIN FILMS; ROOM TEMPERATURE; THIN FILMS-THICKNESS;

MAGNETIC THIN FILMS;

EID: 14944374449 PISSN: 03048853 EISSN: None Source Type: Journal
DOI: 10.1016/j.jmmm.2004.11.247 Document Type: Article

Times cited : (21)

References (11)

1
- 0032560161
- T. Osaka, M. Takai, K. Hayashi, K. Ohashi, M. Saito, and K. Yamada Nature 392 1998 796
- (1998) Nature , vol.392 , pp. 796
- Osaka, T.¹ Takai, M.² Hayashi, K.³ Ohashi, K.⁴ Saito, M.⁵ Yamada, K.⁶

2
- 0034260449
- X. Liu, P. Evans, and G. Zangari IEEE Trans. Magn. 36 2000 3479
- (2000) IEEE Trans. Magn. , vol.36 , pp. 3479
- Liu, X.¹ Evans, P.² Zangari, G.³

3
- 0027579215
- D.L. Grimmett, M. Schwartz, and K. Nobe J. Electrochem. Soc. 140 1993 973
- (1993) J. Electrochem. Soc. , vol.140 , pp. 973
- Grimmett, D.L.¹ Schwartz, M.² Nobe, K.³

4
- 0034817505
- H.S. Nam, T. Yokoshima, T. Nakanishi, T. Osaka, Y. Yamazaki, and D.N. Lee Thin Solid Films 384 2001 288
- (2001) Thin Solid Films , vol.384 , pp. 288
- Nam, H.S.¹ Yokoshima, T.² Nakanishi, T.³ Osaka, T.⁴ Yamazaki, Y.⁵ Lee, D.N.⁶

5
- 0000004872
- X. Liu, G. Zangari, and L. Shen J. Appl. Phys. 87 2000 5410
- (2000) J. Appl. Phys. , vol.87 , pp. 5410
- Liu, X.¹ Zangari, G.² Shen, L.³

6
- 0142119147
- E.H. du Marchie van Voorthuysen, F.T. ten Broek, N.G. Chechenin, and D.O. Boerma J. Magn. Magn. Mater 266 2003 251
- (2003) J. Magn. Magn. Mater , vol.266 , pp. 251
- Du Marchie Van Voorthuysen, E.H.¹ Ten Broek, F.T.² Chechenin, N.G.³ Boerma, D.O.⁴

7
- 14944369532
- University of Technolongy, Sydney, Australia
- A.A. Coehlo, R.W. Cheary, X-ray line fitting program XFIT, University of Technolongy, Sydney, Australia.
- X-ray Line Fitting Program XFIT
- Coehlo, A.A.¹ Cheary, R.W.²

8
- 0001685263
- P.L. Néel J. Phys. Radiat. 17 1956 250
- (1956) J. Phys. Radiat. , vol.17 , pp. 250
- Néel, P.L.¹

9
- 0000744957
- Y.P. Zhao, R.M. Gamache, G.-C. Wang, T.M. Lu, G. Palasantzas, and J.Th.M. De Hosson J. Appl. Phys. 89 2001 1325
- (2001) J. Appl. Phys. , vol.89 , pp. 1325
- Zhao, Y.P.¹ Gamache, R.M.² Wang, G.-C.³ Lu, T.M.⁴ Palasantzas, G.⁵ De Hosson, J.Th.M.⁶

10
- 0001651737
- N.V. Myung, and K. Nobe Electrochem. Soc. 148 3 2001 C136-44
- (2001) Electrochem. Soc. , vol.148 , Issue.3
- Myung, N.V.¹ Nobe, K.²

11
- 0032162825
- P.C. Andriacos, and N. Robertson IBM J. Res. Dev. 42 1998 671
- (1998) IBM J. Res. Dev. , vol.42 , pp. 671
- Andriacos, P.C.¹ Robertson, N.²

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.