Facile synthesis of silver nanoparticles useful for fabrication of high-conductivity elements for printed electronics

Journal of the American Chemical Society

Volumn 127, Issue 10, 2005, Pages 3266-3267

  Li, Yuning ^a   Wu, Yiliang ^a   Ong, Beng S ^a  

^a XEROX RESEARCH CENTRE OF CANADA   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

ALIPHATIC AMINE; NANOPARTICLE; SILVER;

ARTICLE; ELECTRODE; ELECTRONICS; LOW TEMPERATURE; PARTICLE SIZE; SYNTHESIS;

EID: 14944342652     PISSN: 00027863     EISSN: None     Source Type: Journal    
DOI: 10.1021/ja043425k     Document Type: Article

References (25)

1. Katz, H.; Bao, Z.; Gilat, S. Acc. Chem. Res. 2001, 34, 359-369.
2. (b) Dimitrakopoulos, C. D.; Malenfant, P. R. L. Adv. Mater. 2002, 14, 99-117.
3. Kagan, C. R.; Mitzi, D. B.; Dimitrakopoulos, C. D. Science 1999, 286, 945-947.
4. Huitena, H. E. A.; Gelinck, G. H.; van der Putter, J. B. P. H.; Kuijk, K. E.; Hart, C. M.; Cantatore, E.; Herwig, P. T.; van Breemen, A. J. J. M.; de Leeuw, D. M. Nature 2001, 414, 599-600.
5. Ong, B. S.; Wu, Y.; Liu, P.; Gardner, S. J. Am. Chem. Soc. 2004, 126, 3378-3379.
6. (b) Ong, B. S.; Wu, Y.; Liu, P.; Jiang, L.; Murti, K. Synth. Met. 2004, 142, 49-52.
7. Sirringhaus, H.; Tessler, N.; Friends, R. H. Science 1998, 280, 1741-1744.
8. (b) Sirringhaus, H.; Kawasem, T.; Friend, R. H.; Shimoda, T.; Inbasekaran, M.; Wu, W.; Woo, E. P. Science 2000, 290, 2123-2126.
9. Gelinck, G. H.; Geuns, T. C. T.; de Leeuw, D. M. Appl. Phys. Lett. 2000, 77, 1487-1489.
10. Kawase, T.; Sirringhaus, H.; Friend, R. H.; Shimoda, T. Adv. Mater. 2001, 13, 1601-1605.
11. Wu, Y.; Li, Y.; Ong, B.; Liu, P.; Gardner, S.; Chiang, B. Adv. Mater. 2005, 17, 184-187.
12. (b) Huang, D.; Liao, F.; Molesa, S.; Redinger, D.; Subramanian, V. J. Electrochem. Soc. 2003, 150, 412-417.
13. Tate, J.; Rogers, J. A.; Jones, C. D. W.; Li, W.; Bao, Z.; Murphy, D. W.; Slusher, R. E.; Dodabalapur, A.; Katz, H. E.; Lovinger, A. J. Langmuir 2000, 16, 6054-6060.
14. Gray, C.; Wang, J.; Duthaler, G.; Ritenour, A.; Drzaic, P. Proceedings of SPIE 2001, 4466, 89-94.
15. -1 at > 200°C.
16. Fuller, S. B.; Wilhelm, E. J.; Jacobson, J. M. J. Microelectromech. Syst. 2002, 11, 54-60.
17. Buffat, P.; Borel, J. P. Phys. Rev. A 1976, 13, 2287-2298.
18. Brust, M.; Walker, M.; Bethell, D.; Schiffrin, D. J.; Whyman, R. J. Chem. Soc., Chem. Commun. 1994, 801.
19. (b) Collier, C. P.; Saykally, R. J.; Shiang, J. J.; Henrichs, S. E.; Heath, J. R. Science 1997, 277, 1978-1981.
20. Wang, W.; Efrima, S.; Regev, O. Langmuir 1998, 14, 602-610.
21. (b) Wang, W.; Chen, X.; Efrima, S. J. Phys. Chem. B 1999, 103, 7238-7246.
22. Cliffel, D. E.; Zamborini, F. P.; Gross, S. M.; Murray, R. W. Langmuir 2000, 16, 9699-9702.
23. Mayer, A. B. R.; Grebner, W.; Wannemacher, R. J. Phys. Chem. B 2000, 104, 7278-7285.
24. (b) Pastoriza, I.; Liz-Marzán, L. M. Langmuir 2002, 18, 2888-2894.
25. Hiramatsu, H.; Osterloh, F. Chem. Mater. 2004, 16, 2509-2511.