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Volumn 290-291 PART 1, Issue , 2005, Pages 723-726

Micromagnetic simulation as a bridge between magnetic-force and magnetic-transmission X-ray microscopy

Author keywords

Domain pattern; Domain wall pinning; Magnetic force microscopy; Micromagnetic calculation; Stray field; X ray dichroism

Indexed keywords

COMPUTER SIMULATION; MAGNETIC ANISOTROPY; MAGNETIC FIELD EFFECTS; MAGNETIZATION; MICROSCOPIC EXAMINATION; SILICON NITRIDE;

EID: 14944338626     PISSN: 03048853     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jmmm.2004.11.276     Document Type: Conference Paper
Times cited : (3)

References (11)
  • 6
    • 0003603277 scopus 로고    scopus 로고
    • Interagency Report NISTIR 6376, National Institute of Standards and Technology, Gaithersburg, MD (Sept)
    • M.J. Donahue, D.G. Porter, OOMMF User's Guide, Version 1.0. Interagency Report NISTIR 6376, National Institute of Standards and Technology, Gaithersburg, MD (Sept 1999).
    • (1999) OOMMF User's Guide, Version 1.0
    • Donahue, M.J.1    Porter, D.G.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.