Growth of Bi-Sb alloy thin films and their characterization by TEM, PIXE and RBS

Solid State Communications

Volumn 134, Issue 3, 2005, Pages 211-216

  Mallik, Ramesh Chandra ^a   Das, V Damodara ^a  

^a INDIAN INSTITUTE OF TECHNOLOGY MADRAS   (India)

Author keywords

C. Thin film structure and morphology; C. Transmission electron microscopy; C. X Ray diffraction; E. Rutherford backscattering spectroscopy

Indexed keywords

ANTIMONY; BISMUTH ALLOYS; ELECTRIC CONDUCTIVITY; GRAIN SIZE AND SHAPE; MIXTURES; RUTHERFORD BACKSCATTERING SPECTROSCOPY; STOICHIOMETRY; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION;

BULK MATERIALS; PHASE HOMOGENEITY; PROTON-INDUCED X-RAY EMISSION (PIXE); THIN FILM STRUCTURE AND MORPHOLOGY;

THIN FILMS;

EID: 14744294823     PISSN: 00381098     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ssc.2004.11.049     Document Type: Article

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