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Volumn 230, Issue 1-4, 2005, Pages 489-494
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Secondary neutral and ionized particle measurements under MeV-energy ion bombardment
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Author keywords
Axial emission energy; Electronic sputtering; Secondary ion; Secondary neutral
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Indexed keywords
ION BEAMS;
LASER PULSES;
LIGHT REFLECTION;
PHOTOIONIZATION;
SECONDARY EMISSION;
SILICON;
ULTRAVIOLET RADIATION;
AXIAL EMISSION ENERGY;
ELECTRONIC SPUTTERING;
SECONDARY ION;
SECONDARY NEUTRAL PARTICLES;
ION BOMBARDMENT;
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EID: 14744293960
PISSN: 0168583X
EISSN: None
Source Type: Journal
DOI: 10.1016/j.nimb.2004.12.089 Document Type: Conference Paper |
Times cited : (2)
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References (18)
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