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Volumn 230, Issue 1-4, 2005, Pages 489-494

Secondary neutral and ionized particle measurements under MeV-energy ion bombardment

Author keywords

Axial emission energy; Electronic sputtering; Secondary ion; Secondary neutral

Indexed keywords

ION BEAMS; LASER PULSES; LIGHT REFLECTION; PHOTOIONIZATION; SECONDARY EMISSION; SILICON; ULTRAVIOLET RADIATION;

EID: 14744293960     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2004.12.089     Document Type: Conference Paper
Times cited : (2)

References (18)
  • 13
    • 0003311325 scopus 로고
    • Nat. Bur. Stand. (US) US GPO, Washington, DC
    • C.E. Moore, Atomic Energy Levels, Vol. III, Nat. Bur. Stand. (US), 35, US GPO, Washington, DC, 1971
    • (1971) Atomic Energy Levels , vol.3 , pp. 35
    • Moore, C.E.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.