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Volumn 103, Issue 1-2, 2004, Pages 356-361

The influence of thermal treatment on the stress characteristics of suspended porous silicon membranes on silicon

Author keywords

Micro hotplates; Porous silicon; Stress; Suspended membranes

Indexed keywords

ANNEALING; ANODIC OXIDATION; CHEMICAL VAPOR DEPOSITION; ETCHING; HEAT TREATMENT; ION IMPLANTATION; MEMBRANES; OHMIC CONTACTS; RAMAN SPECTROSCOPY; STRESS ANALYSIS;

EID: 14744290062     PISSN: 09254005     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.snb.2004.04.065     Document Type: Conference Paper
Times cited : (14)

References (14)
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  • 9
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    • Strain Characterization of Semiconductor structures and superlattices
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.