Radiation effects under multiply charged ion impacts

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 116, Issue 1-4, 1996, Pages 478-481

  Parilis, E ^a  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL DEFECTS; DELAMINATION; ION BOMBARDMENT; IONS; MATHEMATICAL MODELS; MICA; SURFACES; XENON;

AUGER NEUTRALIZATION PROCESS; BLISTERS; CRATERS; ELECTROSTATIC COULOMB REPULSION; ION ENERGY DEPENDENCE; LOCAL CHARGE DEPLETION;

CHEMICAL MODIFICATION;

EID: 0030217286     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/0168-583X(96)00092-4     Document Type: Article

References (11)

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2. S.T. De Zwart et al., Surf. Sci. 177 (1986) L939.
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4. E.S. Parilis, in: Atomic Collisions in Solids, ed. D.W. Palmer (North-Holland, Amsterdam, 1970) p. 324.
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7. Sandia National Laboratories Report SAND95, UC-411, January 1995.
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10. J.W. McDonald et al., Phys. Rev. Lett. 68 (1992) 2297.
11. D. Schneider, M.A. Briere, J. McDonald and W. Siekhaus, Nucl. Instr. and Meth. B 87 (1994) 156.