An investigation of structures of thermal and anodic tantalum oxide films

Journal of the Electrochemical Society

Volumn 152, Issue 2, 2005, Pages

  Maeng, S ^a   Axe, L ^a   Tyson, T ^b   Jiang, A ^b  

^a NEW JERSEY INSTITUTE OF TECHNOLOGY   (United States)

^b NEW JERSEY INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANODIC OXIDATION; CRYSTAL STRUCTURE; HIGH TEMPERATURE EFFECTS; POWDERS; TANTALUM COMPOUNDS; THERMOOXIDATION; X RAY DIFFRACTION;

ANODIC OXIDE FILMS; OXIDATION PRODUCTS; TOTAL ELECTRON YIELD (TEY); X-RAY ABSORPTION SPECTROSCOPY;

THIN FILMS;

EID: 14744269610     PISSN: 00134651     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.1850362     Document Type: Article

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