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Volumn 47, Issue 3, 2002, Pages 415-419
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Rietveld analysis of X-ray diffraction pattern from β-Ta2O5 oxide
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Author keywords
[No Author keywords available]
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Indexed keywords
OXIDE;
TANTALUM;
ARTICLE;
CRYSTAL STRUCTURE;
LOW TEMPERATURE;
STRUCTURE ANALYSIS;
X RAY DIFFRACTION;
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EID: 0036018382
PISSN: 10637745
EISSN: None
Source Type: Journal
DOI: 10.1134/1.1481927 Document Type: Article |
Times cited : (95)
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References (8)
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