Sample preparation for evaluation of detection limits in X-ray fluorescence spectrometry

Analytical Sciences

Volumn 21, Issue 2, 2005, Pages 143-147

  Tiwari, M K ^a   Singh, A K ^a   Sawhney, K J S ^a,b  

^a RAJA RAMANNA CENTRE FOR ADVANCED TECHNOLOGY   (India)

^b RUTHERFORD APPLETON LABORATORY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ENERGY DISPERSIVE SPECTROSCOPY; FLUORESCENCE; FLUORESCENCE SPECTROSCOPY; SPECTROMETRY;

ANALYTE CONCENTRATION; ANALYTES; DETECTION LIMITS; ENERGY-DISPERSIVE X-RAY FLUORESCENCE TECHNIQUES; MASS CONCENTRATION; SAMPLE PREPARATION; TOTAL REFLECTION X-RAY FLUORESCENCE; X RAY FLUORESCENCE SPECTROMETRY;

X RAYS;

CADMIUM; CHROMIUM; SILICON; ZINC;

ARTICLE; CALIBRATION; ENERGY; MASS; REPRODUCIBILITY; SAMPLE; X RAY FLUORESCENCE;

EID: 14644395546     PISSN: 09106340     EISSN: None     Source Type: Journal    
DOI: 10.2116/analsci.21.143     Document Type: Article

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27. 2. To determine the self-absorption correction for analyte signal, normalization of A factor to that in case of blank sample is needed (A = 1 represents no absorption and A = 1.10 means 10% absorption of analyte intensity).