Wavelength-dispersive total reflection X-ray fluorescence with high-brilliance undulator radiation at SPring-8

Japanese journal of applied physics

Volumn 39, Issue 12 A, 2000, Pages

  Awaji, Naoki ^a   Ozaki, Shinji ^b   Nishino, Junichi ^c   Noguchi, Sinichi ^d   Yamamoto, Tohru ^d   Syoji, Takashi ^e   Yamagami, Motoyuki ^e   Kobayashi, Akira ^f   Hirai, You ^g   Shibata, Masahiro ^h   Yamaguchi, Koji ^h   Liu, Kuang Yu ⁱ   Kawado, Seiji ^i,p   Takahashi, Mamoru ^j   Yasuami, Shigeru ^a,j   Konomi, Ichiro ^k   Kimura, Shigeru ^l   Hirai, Yasuharu ^m   Hasegawa, Masaki ^m   Komiya, Satoshi ^a   Hirose, Takayuki ⁿ   Okajima, Toshihiro ^o,q   more..

^a FUJITSU LABORATORIES LTD   (Japan)

^b Matsushita Technoresearch Inc   (Japan)

^c SANYO ELECTRIC CO LTD   (Japan)

^d CENTRAL RESEARCH INSTITUTE OF ELECTRIC POWER INDUSTRY   (Japan)

^e Rigaku Corporaton   (Japan)

^f KOBE STEEL LTD   (Japan)

^g KOBELCO RESEARCH INSTITUTE INC   (Japan)

^h SUMITOMO ELECTRIC INDUSTRIES LTD   (Japan)

ⁱ SONY CORPORATION   (Japan)

^j TOSHIBA CORPORATION   (Japan)

^k Rd Management Section   (Japan)

^l NEC CORPORATION   (Japan)

^m HITACHI LTD   (Japan)

ⁿ FUJI ELECTRIC CO   (Japan)

^o MITSUBISHI ELECTRIC CORPORATION   (Japan)

^p RIGAKU CORPORATION   (Japan)

^q JASRI   (Japan)

more..

Author keywords

[No Author keywords available]

Indexed keywords

IMPURITIES; METALS; SYNCHROTRON RADIATION; WAVELENGTH DISPERSIVE SPECTROSCOPY; X RAY APPARATUS;

ENERGY DISPERSIVE (ED) SOLID STATE DETECTORS (SSD);

FLUORESCENCE;

EID: 0034476224     PISSN: 00214922     EISSN: None     Source Type: None    
DOI: 10.1143/jjap.39.l1252     Document Type: Article

References (10)