Thickness dependence of polarization in ferroelectric perovskite thin films

Journal of Physics D: Applied Physics

Volumn 38, Issue 4, 2005, Pages 584-589

  Liu, Gang ^a   Nan, Ce Wen ^a  

^a TSINGHUA UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

DATA ACQUISITION; EPITAXIAL GROWTH; FERROELECTRIC MATERIALS; PEROVSKITE; POLARIZATION; RESIDUAL STRESSES; THERMODYNAMICS;

FERROELECTRIC PEROVSKITE THIN FILMS; SIZE EFFECTS; SURFACE EFFECT; THICKNESS DEPENDENCE;

ULTRATHIN FILMS;

EID: 14544302396     PISSN: 00223727     EISSN: None     Source Type: Journal    
DOI: 10.1088/0022-3727/38/4/010     Document Type: Article

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