Bayesian surface estimation for white light interferometry

Optical Engineering

Volumn 44, Issue 1, 2005, Pages 1-9

  Hissmann, Michael ^a   Hamprecht, Fred A ^b  

^a ROBERT BOSCH GMBH   (Germany)

^b UNIVERSITY OF HEIDELBERG   (Germany)

Author keywords

Adaptive filter; Bayesian inference; Contextual information; Image denoising; Median filter; Outlier detection; Roughness; Surface inspection

Indexed keywords

ADAPTIVE FILTERING; DATA ACQUISITION; DATA RECORDING; IMAGE PROCESSING; INFORMATION THEORY; LIGHT MEASUREMENT; SIGNAL DETECTION; SURFACE ROUGHNESS;

BAYESIAN SURFACE ESTIMATION; CONTEXTUAL INFORMATION; IMAGE DENOISING; OUTLIER DETECTION; WHITE LIGHT INTERFEROMETRY;

INTERFEROMETRY;

EID: 14544294414     PISSN: 00913286     EISSN: None     Source Type: Journal    
DOI: 10.1117/1.1829651     Document Type: Article

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