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Volumn 109-110, Issue , 1996, Pages 105-108

High resolution PIXE instrumentation survey. Part III

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL ANALYSIS; ION BEAMS; PARTICLE ACCELERATORS; X RAY SPECTROMETERS;

EID: 0030122711     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/0168-583X(95)00892-6     Document Type: Article
Times cited : (9)

References (55)
  • 5
    • 34249922839 scopus 로고
    • Proc. 5th Conf. on the physics of highly charged ions
    • Giessen, FRG, 10-14 September 1990, eds. E. Salzborn, P.H. Mokler and A. Müller
    • J.J. Bonnet, A. Fleury, M. Bonnefoy, M. Chassevent, T. Lamy, A. Brenac, A. Simionovici, H.J. Andrä and S. Andriamonje, Proc. 5th Conf. on the Physics of Highly Charged Ions, Giessen, FRG, 10-14 September 1990, eds. E. Salzborn, P.H. Mokler and A. Müller, Suppl. to Z. Phys. D 21 ,(1991) S343.
    • (1991) Z. Phys. D , vol.21 , Issue.SUPPL.
    • Bonnet, J.J.1    Fleury, A.2    Bonnefoy, M.3    Chassevent, M.4    Lamy, T.5    Brenac, A.6    Simionovici, A.7    Andrä, H.J.8    Andriamonje, S.9
  • 7
    • 58149212505 scopus 로고
    • Proc. Conf. on the application of accelerators in research and industry
    • Denton, TX, USA, 1994
    • D.H. Morse, G.S. Bench, S.P.H.T. Freeman and A.B. Pontau, Proc. Conf. on the Application of Accelerators in Research and Industry, Denton, TX, USA, 1994, Nucl. Instr. and Meth. B 99 (1995) 427.
    • (1995) Nucl. Instr. and Meth. B , vol.99 , pp. 427
    • Morse, D.H.1    Bench, G.S.2    Freeman, S.P.H.T.3    Pontau, A.B.4
  • 54
    • 0042321546 scopus 로고
    • Diplom Thesis, Universität Münster
    • S. Ost, Diplom Thesis, Universität Münster 1981.
    • (1981)
    • Ost, S.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.