Surface structural sensitivity of convergent-beam RHEED: Si (001) 2x1 models compared with dynamical simulations

Ultramicroscopy

Volumn 81, Issue 3-4, 2000, Pages 235-244

  Zuo, J M ^a   Weierstall, U ^a   Peng, L M ^b   Spence, J C H ^a  

^a ARIZONA STATE UNIVERSITY   (United States)

^b PEKING UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

CAMERAS; COMPUTER SIMULATION; ELECTRON BEAMS; LOW ENERGY ELECTRON DIFFRACTION; SENSITIVITY ANALYSIS; SILICON; SURFACE STRUCTURE; X RAY DIFFRACTION;

CONVERGENT BEAM; DIMER TILT; MICRON SIZE PROBE; SURFACE ATOMIC STRUCTURE;

REFLECTION HIGH ENERGY ELECTRON DIFFRACTION;

ARTICLE; ATOM; COMPUTER SIMULATION; ELECTRON BEAM; MOLECULAR DYNAMICS; SURFACE PROPERTY; TECHNIQUE; THEORY; X RAY ANALYSIS;

EID: 0034077099     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(99)00183-7     Document Type: Article

References (36)

1. W.N. Unertl, Physical Structure, Handbook of Surface Science, Vol. 1, North-Holland, Amsterdam, 1996.
2. Ichimiya A. Surf. Sci. 192:1987;L893.
3. Ma Y., Lordi S., Eades J.A. Surf. Sci. 313:1994;317.
4. Horio Y. Surf. Rev. Lett. 4:1997;977.
5. McCoy J.M., Korte U., Maksym P.A. Surf. Sci. 261:1992;29.
6. Hanada T., Ino S., Daimon H. Surf. Sci. 313:1994;143.
7. Maksym P.A., Beeby J.L. Surf. Sci. 110:1981;423.
8. Ichimiya A. Jpn. J. Appl. Phys. 22:1983;176.
9. Ichimiya A. Jpn. J. Appl. Phys. 24:1985;1365.
10. Peng L.M., Dudarev S.L., Whelan M.J. Acta Crystallogr. A. 52:1996;471.
11. L.M. Peng, Developments of dynamical theory of RHEED and applications to the in-situ monitoring of MBE growth, in: P.B. Hirsch (Ed.), Topics of Electron Diffraction and Microscopy of Materials, IOP, London, in preparation.
12. Horio Y. Jpn. J. Appl. Phys. 35:1996;3559.
13. Ichimiya A., Kambe K., Lehmpfuhl G. J. Phys. Soc. Jpn. 49:1980;684.
14. U. Weierstall, J. M. Zuo, T. Kjørsvik, J.C.H. Spence, Surf. Sci., 1999, submitted for publication.
15. Smith A.E., Lehmpfuhl G., Uchida Y. Ultramicroscopy. 41:1992;367.
16. Spence J.C.H., Zuo J.M. Electron Microdiffraction. 1992;Plenum, New York.
17. Ma Y., Lordi S., Eades J.A. Ultramicroscopy. 60:1995;137.
18. Jedrecy N., Sauvage-Simkin M., Pinchaux R., Massies J., Greiser N., Etgens V.H. Surf. Sci. 230:1990;197.
19. Over H., Wassserfall J., Ranke W., Sawitzki R., Ambiatello C., Moritz C. Phys. Rev. B. 55:1997;4731.
20. Doi T., Ichikawa M. J. Crystal Growth. 95:1989;468.
21. Sakamoto T., Hashiguchi G. Jpn. J. Appl. Phys. 25:1986;L78.
22. Smith A.E., Lynch D.F. J. Vac. Sci. Technol. A. 5:1987;1262.
23. Tornarie M. J. Phys. Soc. Jpn. 17(suppl. B-II):1962;98.
24. Maksym P.A. Surf. Rev. Lett. 4:1997;513.
25. Zhao T.C., Poon H.C., Tong S.Y. Phys. Rev. B. 38:1988;1172.
26. Dudarev S.L., Peng L.M., Whelan M.J. Surf. Sci. 330:1995;86.
27. Jones R.O., Jennings P.J. Surf. Sci. Rep. 9(4):1988;165.
28. http://www.netlib.org/.
29. Zuo J.M., Weickenmeier A.L. Ultramicroscopy. 57:1995;375.
30. Chadi D.J. Phys. Rev. Lett. 43:1979;43.
31. Dabrowski J., Scheffler M. Appl. Surf. Sci. 56-58:1992;15.
32. Himpsel F.J., Eastman D.E. J. Vac. Sci. Technol. 16:1979;1297.
33. Tromp R.M., Smeenk R.G., Saris F.W., Chadi D.J. Surf. Sci. 133:1983;137.
34. Hammer R.J., Tromp R.M., Demuth J.E. Phys. Rev. B. 34:1986;5343.
35. Wolkow R.A. Phys. Rev. Lett. 68:1992;2636.
36. Rose H., Krahl D. Electron optics of imaging energy-filters. Reimer L. Energy-Filtering Transmission Electron Microscopy. 1995;Springer, New York.