Ultralow-Energy Excitations and Prospects for Spatially Resolved Spectroscopy

Microscopy and Microanalysis

Volumn 10, Issue 1, 2004, Pages 28-33

  Howie, A ^a  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

Author keywords

Apertureless near field microscopy; PEEM; Pulsed beam STEM; SEAM; Spatial spectroscopy

Indexed keywords

CONFERENCE PAPER; ELECTRON; METHODOLOGY; MICROSCOPY; PHOTON; SCANNING ELECTRON MICROSCOPY; SPECTROSCOPY;

ELECTRONS; MICROSCOPY; MICROSCOPY, ELECTRON, SCANNING; PHOTONS; SPECTRUM ANALYSIS;

EID: 1442289766     PISSN: 14319276     EISSN: None     Source Type: Journal    
DOI: 10.1017/S1431927604040280     Document Type: Conference Paper

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