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Volumn 65, Issue 1, 2000, Pages 1-64

Image potential in scanning transmission electron microscopy

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON ENERGY LOSS SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0033707177     PISSN: 00796816     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0079-6816(00)00005-8     Document Type: Review
Times cited : (62)

References (172)
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    • Ahn, C.C.1    Krivanek, O.L.2
  • 14
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    • Surface plasmons on smooth and rough surfaces and on gratings
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    • (1988) Springer Tracts in Modern Physics , vol.111
    • Raether, H.1
  • 17
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    • Z.L. Wang, Elastic and Inelastic Scattering in Electron Diffraction and Imaging, Plenum Press, New York, 1995; Micron 27, 265, 1996.
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    • Walsh, C.A.1
  • 133
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    • Doctoral thesis, University of Basque Country, San Sebastian
    • J. Aizpurua, Doctoral thesis, University of Basque Country, San Sebastian, 1998.
    • (1998)
    • Aizpurua, J.1
  • 135
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    • (1991) Nature , vol.354 , pp. 56
    • Ijima, S.1
  • 160
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    • Ph.D. thesis, University of Cambridge
    • A.P. Stephens, Ph.D. thesis, University of Cambridge, 1987.
    • (1987)
    • Stephens, A.P.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.