Cross sectional TEM observation of gas-ion-irradiation induced surface blisters and their precursors in SiC

Materials Transactions

Volumn 44, Issue 12, 2003, Pages 2599-2604

  Muto, Shunsuke ^a   Tanabe, Tetsuo ^a   Maruyama, Tadashi ^b  

^a NAGOYA UNIVERSITY   (Japan)

^b Wakasawan Energy Research Center   (Japan)

Author keywords

Blister; Cross sectional transmission electron microscopy; Helium; Hydrogen; Ion irradiation; Silicon carbide

Indexed keywords

ABSORPTION; BUBBLE FORMATION; CHEMICAL BONDS; ELECTRON ENERGY LOSS SPECTROSCOPY; IONS; IRRADIATION; NUCLEATION; SATURATION (MATERIALS COMPOSITION); SURFACE STRUCTURE; TRANSMISSION ELECTRON MICROSCOPY;

GAS ION IRRADIATION; IMAGING FILTER; SURFACE BLISTERS;

SILICON CARBIDE;

EID: 1442287116     PISSN: 13459678     EISSN: None     Source Type: Journal    
DOI: 10.2320/matertrans.44.2599     Document Type: Article

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