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Volumn 10, Issue 5, 2003, Pages 433-436
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Growth and characterization of vacuum deposited cadmium telluride thin films
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Author keywords
[No Author keywords available]
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Indexed keywords
ABSORPTION EDGE;
POST-DEPOSITION HEAT TREATMENT;
THERMAL EVAPORATION TECHNIQUE;
ACTIVATION ENERGY;
CHARACTERIZATION;
COMPOSITION;
CRYSTALLOGRAPHY;
GRAIN BOUNDARIES;
GROWTH (MATERIALS);
OPTOELECTRONIC DEVICES;
PHOTODIODES;
POLYCRYSTALLINE MATERIALS;
SEMICONDUCTING TELLURIUM;
SEMICONDUCTOR LASERS;
SINGLE CRYSTALS;
SPECTROPHOTOMETRY;
STOICHIOMETRY;
THIN FILMS;
TRANSMISSION ELECTRON MICROSCOPY;
CADMIUM ALLOYS;
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EID: 1442286872
PISSN: 09714588
EISSN: 09751017
Source Type: Journal
DOI: None Document Type: Article |
Times cited : (1)
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References (16)
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