Radiation damage of silicon structures with electrons of 900 MeV

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 485, Issue 1-2, 2002, Pages 126-132

  Rachevskaia, I ^a   Bettarini, S ^b   Bosisio, L ^c   Dittongo, S ^c   Quai, E ^c   Rizzo, G ^b  

^a ITC IRST   (Italy)

^b UNIVERSITY OF PISA   (Italy)

^c UNIVERSITY OF TRIESTE   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CURRENT MEASUREMENT; ELECTRIC RESISTANCE MEASUREMENT; ELECTRON IRRADIATION; PARTICLE DETECTORS; RADIATION DAMAGE;

SILICON MICROSTRIP DETECTORS;

SILICON SENSORS;

EID: 14244272469     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(02)00543-0     Document Type: Conference Paper

References (5)