Energy dependence of damage to Si PIN diodes exposed to β radiation

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 396, Issue 1-2, 1997, Pages 165-171

  Lauber, Jan A ^a   Gascon Shotkin, Susan ^b   Kellogg, Richard G ^b   Martinez, German R ^b  

^a UNIVERSITY COLLEGE LONDON   (United Kingdom)

^b NONE

Author keywords

[No Author keywords available]

Indexed keywords

DIODES; ELECTRON BEAMS; ELECTRON SOURCES; LEAKAGE CURRENTS; PARTICLE DETECTORS; SEMICONDUCTING SILICON; STRONTIUM;

BETA RADIATION; LUMINOMETERS;

RADIATION DAMAGE;

EID: 0031235391     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(97)00742-0     Document Type: Article

References (6)

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2. G. Lindström, DESY Report 90-109 (1990).
3. A. Federspiel et al., Nucl. Instr. and Meth. A 288 (1990) 68.
4. Fretwurst et al., Nucl. Instr. and Meth. A 326 (1993) 357.
5. L.S. Brown et al., Review of Particle Properties, Phys. Rev. D 50, 1994.
6. G. Hall, Large Hadron Collider Workshop CERN 90-10, vol III, 1990, p. 693.