메뉴 건너뛰기




Volumn 3, Issue , 2004, Pages 3062-3067

Experimental implementation of a model-based inverse filter to attenuate hysteresis in an atomic force microscope

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; APPROXIMATION THEORY; CLOSED LOOP CONTROL SYSTEMS; DYNAMICS; FREQUENCIES; MATHEMATICAL MODELS; MICROSCOPES; PIEZOELECTRIC MATERIALS;

EID: 14244256798     PISSN: 07431546     EISSN: 25762370     Source Type: Conference Proceeding    
DOI: 10.1109/cdc.2004.1428936     Document Type: Conference Paper
Times cited : (4)

References (10)
  • 1
    • 0002199949 scopus 로고    scopus 로고
    • Creep, hysteresis, and vibration compensation for piezoactuators: Atomic force microscopy application
    • D. Croft, G. Shed and S. Devasia, "Creep, hysteresis, and vibration compensation for piezoactuators: Atomic force microscopy application," Journal of Dynamic Systems, Measurement, and Control, 23, pp. 35-43, 2001.
    • (2001) Journal of Dynamic Systems, Measurement, and Control , vol.23 , pp. 35-43
    • Croft, D.1    Shed, G.2    Devasia, S.3
  • 2
    • 0033284471 scopus 로고    scopus 로고
    • Piezoelectric scanners for atomic force microscopes: Design of lateral sensors, identification and control
    • San Diego, CA
    • A. Daniele, S. Salapaka, M.V. Salapaka and M. Dahleh, "Piezoelectric scanners for atomic force microscopes: Design of lateral sensors, identification and control," Proceedings of the America Control Conference, San Diego, CA, pp. 253-257, 1999.
    • (1999) Proceedings of the America Control Conference , pp. 253-257
    • Daniele, A.1    Salapaka, S.2    Salapaka, M.V.3    Dahleh, M.4
  • 3
    • 0024286273 scopus 로고
    • Scanning tunneling microscopy and atomic force microscopy: Application to biology and technology
    • P.K. Hansma, V.B. Elings, O. Marti and C.E. Bracker, "Scanning tunneling microscopy and atomic force microscopy: Application to biology and technology," Science, 242, pp. 209-242, 1988.
    • (1988) Science , vol.242 , pp. 209-242
    • Hansma, P.K.1    Elings, V.B.2    Marti, O.3    Bracker, C.E.4
  • 9
    • 0242420102 scopus 로고    scopus 로고
    • Model development for the positioning mechanisms in an atomic force microscope
    • R.C. Smith and M. Salapaka, "Model development for the positioning mechanisms in an atomic force microscope," International Series of Numerical Mathematics, Vol 143, pp. 249-269, 2002.
    • (2002) International Series of Numerical Mathematics , vol.143 , pp. 249-269
    • Smith, R.C.1    Salapaka, M.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.