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Physical Review B - Condensed Matter and Materials Physics

Volumn 70, Issue 22, 2004, Pages

Stripe characterization in La1.6-xNd0.4Sr xCuO4 thin films

(6) Liu, Y a Qu, J F a Zhu, M a Zhang, S D a Feng, S J a Li, X G a

a NONE

Author keywords

[No Author keywords available]

Indexed keywords

COPPER; METAL; NEODYMIUM; OXIDE; STRONTIUM;

ARTICLE; CRYSTAL; ELECTRIC POTENTIAL; FILM; LOW TEMPERATURE; MEASUREMENT; MICROWAVE OVEN; PHASE TRANSITION; SUPERCONDUCTOR; TEMPERATURE DEPENDENCE; X RAY DIFFRACTION;

EID: 13944262102 PISSN: 10980121 EISSN: 1550235X Source Type: Journal
DOI: 10.1103/PhysRevB.70.224512 Document Type: Article

Times cited : (10)

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