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Volumn 577, Issue 2-3, 2005, Pages 93-94
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Genetic algorithm for finding the reconstruction of semiconductor surfaces
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Author keywords
[No Author keywords available]
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Indexed keywords
BOUNDARY CONDITIONS;
ELECTRONIC EQUIPMENT;
ELECTRONIC STRUCTURE;
GENETIC ALGORITHMS;
LITHOGRAPHY;
LOW ENERGY ELECTRON DIFFRACTION;
MATHEMATICAL MODELS;
MORPHOLOGY;
POTENTIAL ENERGY;
SCANNING TUNNELING MICROSCOPY;
SURFACES;
VECTORS;
CRYSTAL SURFACES;
QUANTUM DEVICES;
SEMICONDUCTOR SURFACES;
SURFACE SCIENCE;
SEMICONDUCTING SILICON;
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EID: 13844318434
PISSN: 00396028
EISSN: None
Source Type: Journal
DOI: 10.1016/j.susc.2005.01.030 Document Type: Short Survey |
Times cited : (3)
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References (13)
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