Studies with Ni/Ti multilayer films using X-ray photoelectron spectroscopy and neutron reflectometry: Microscopic characterization of structure and chemical composition

Thin Solid Films

Volumn 335, Issue 1-2, 1998, Pages 13-18

  Vedpathak, Mahesh ^a   Basu, Saibal ^b   Gokhale, Shubha ^a   Kulkarni, S K ^a  

^a UNIVERSITY OF PUNE   (India)

^b BHABHA ATOMIC RESEARCH CENTRE   (India)

Author keywords

Multilayer; Neutron reflectometry (NR); X ray photoelectron spectroscopy (XPS)

Indexed keywords

DEPOSITION; ELECTRON BEAMS; IMPURITIES; MULTILAYERS; NICKEL; TITANIUM; X RAY PHOTOELECTRON SPECTROSCOPY;

NEUTRON REFLECTOMETRY;

THIN FILMS;

EID: 0032320319     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(98)00863-3     Document Type: Article

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