SNOM investigation of the electromagnetic field intensity and polarization distribution in the vicinity of nanostructures

International Journal of Nanoscience

Volumn 3, Issue 1-2, 2004, Pages 105-113

  Bashevoy, M V ^a   Ezhov, A A ^a   Magnitskii, S A ^a   Muzychenko, D A ^a   Panov, V I ^a   Toursynov, J S ^a   Malakhov, D V ^b  

^a MOSCOW STATE UNIVERSITY   (Russian Federation)

^b SEMENOV INSTITUTE OF CHEMICAL PHYSICS   (Russian Federation)

Author keywords

Nanostructures; Near field optics; Scanning probe microscopy; Super resolution

Indexed keywords

ACTUATORS; APPROXIMATION THEORY; COMPUTATIONAL METHODS; ELECTROMAGNETIC FIELD EFFECTS; FINITE DIFFERENCE METHOD; MATHEMATICAL MODELS; OPTICAL MICROSCOPY; POLARIZATION;

NEAR FIELD OPTICS; SCANNING PROBE MICROSCOPY; SUPERRESOLUTION; VICINITY;

NANOSTRUCTURED MATERIALS;

EID: 13844276801     PISSN: 0219581X     EISSN: None     Source Type: Journal    
DOI: 10.1142/S0219581X04001870     Document Type: Article

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