-
1
-
-
0032629794
-
"Interconnect Technology Trend for Microelectronics"
-
R. Liu, C. Pai, and E. Martinez, "Interconnect Technology Trend for Microelectronics," Solid-State Electron. 43, 1003-1009 (1999).
-
(1999)
Solid-State Electron.
, vol.43
, pp. 1003-1009
-
-
Liu, R.1
Pai, C.2
Martinez, E.3
-
2
-
-
0033262699
-
"Experimental and Analytical Study of Seed Layer Resistance for Copper Damascene Electroplating"
-
E. K. Broadbent, E. J. McInerney, L. A. Gochberg, and R. L. Jackson, "Experimental and Analytical Study of Seed Layer Resistance for Copper Damascene Electroplating," J. Vac. Sci. Technol. B 17, 2584-2595 (1999).
-
(1999)
J. Vac. Sci. Technol. B
, vol.17
, pp. 2584-2595
-
-
Broadbent, E.K.1
McInerney, E.J.2
Gochberg, L.A.3
Jackson, R.L.4
-
3
-
-
13844264770
-
-
International Technology Research Institute World Technology (WTEC) Division, Baltimore
-
P. R. Westmoreland, P. A. Kollman, A. M. Chaka, P. T. Cummings, K. Morokuma, M. Neurock, E. B. Stechel, and P.Vashishta, WTEC Panel Report on Applications of Molecular and Materials Modeling, International Technology Research Institute World Technology (WTEC) Division, Baltimore, 2002.
-
(2002)
WTEC Panel Report on Applications of Molecular and Materials Modeling
-
-
Westmoreland, P.R.1
Kollman, P.A.2
Chaka, A.M.3
Cummings, P.T.4
Morokuma, K.5
Neurock, M.6
Stechel, E.B.7
Vashishta, P.8
-
4
-
-
85039484733
-
"A Novel Electrolyte Composition for Copper Plating in Wafer Metallization"
-
Extended Abstracts of the 195th Meeting of the Electrochemical Society, PV 99-9, Abstract No. 263
-
U. Landau, J. D'Urso, A. Lipin, Y. Dordi, A. Malik, M. Chen, and P. Hey, "A Novel Electrolyte Composition for Copper Plating in Wafer Metallization," Extended Abstracts of the 195th Meeting of the Electrochemical Society, PV 99-9, Abstract No. 263, 25-40 (1999).
-
(1999)
, pp. 25-40
-
-
Landau, U.1
D'Urso, J.2
Lipin, A.3
Dordi, Y.4
Malik, A.5
Chen, M.6
Hey, P.7
-
5
-
-
0033743642
-
"Electroplating Copper onto Resistive Barrier Films"
-
K. Takahashi, "Electroplating Copper onto Resistive Barrier Films," J. Electrochem. Soc. 147, 1414-1417 (2000).
-
(2000)
J. Electrochem. Soc.
, vol.147
, pp. 1414-1417
-
-
Takahashi, K.1
-
6
-
-
0011182923
-
"Theory of the Effect of Electrode Resistance on Current Density Distribution in Electrolytic Cells"
-
C. Tobias and R. Wijsman, "Theory of the Effect of Electrode Resistance on Current Density Distribution in Electrolytic Cells," J. Electrochem. Soc. 100, 459-467 (1953).
-
(1953)
J. Electrochem. Soc.
, vol.100
, pp. 459-467
-
-
Tobias, C.1
Wijsman, R.2
-
7
-
-
0040218285
-
"Transient Behavior During Electrodeposition into a Metal Strip of High Ohmic Resistance"
-
R. Alkire, "Transient Behavior During Electrodeposition into a Metal Strip of High Ohmic Resistance," J. Electrochem. Soc. 118, 1935-1941 (1971).
-
(1971)
J. Electrochem. Soc.
, vol.118
, pp. 1935-1941
-
-
Alkire, R.1
-
8
-
-
0026836631
-
"Nonuniform Current Distribution and Thickness During Electrodeposition onto Resistive Substrates"
-
M. Matlosz, P. H. Vallotton, A. C. West, and D. Landolt, "Nonuniform Current Distribution and Thickness During Electrodeposition onto Resistive Substrates," J. Electrochem. Soc. 139, 752-761 (1992).
-
(1992)
J. Electrochem. Soc.
, vol.139
, pp. 752-761
-
-
Matlosz, M.1
Vallotton, P.H.2
West, A.C.3
Landolt, D.4
-
9
-
-
0025419119
-
"Terminal Effect at a Resistive Electrode Under Tafel Kinetics"
-
O. Lanzi and U. Landau, "Terminal Effect at a Resistive Electrode Under Tafel Kinetics," J. Electrochem. Soc. 137, 1139-1143 (1990).
-
(1990)
J. Electrochem. Soc.
, vol.137
, pp. 1139-1143
-
-
Lanzi, O.1
Landau, U.2
-
10
-
-
0026955262
-
"Numerical-Calculation of Secondary Current Distribution in a 2-Dimensional Electrochemical-Cell with a Resistive Electrode"
-
H. Kawamoto, "Numerical-Calculation of Secondary Current Distribution in a 2-Dimensional Electrochemical-Cell with a Resistive Electrode," J. Appl. Electrochem. 22, 1113-1116 (1992 ).
-
(1992)
J. Appl. Electrochem.
, vol.22
, pp. 1113-1116
-
-
Kawamoto, H.1
-
11
-
-
2542466584
-
"Model of Wafer Thickness Uniformity in an Electroplating Tool"
-
Extended Abstracts of the 195th Meeting of the Electrochemical Society, PV 99-9, Abstract No. 270
-
H. Deligianni, J. O. Dukovic, E. G. Walton, R. J. Contolini, J.Reid, and E. Patton, "Model of Wafer Thickness Uniformity in an Electroplating Tool," Extended Abstracts of the 195th Meeting of the Electrochemical Society, PV 99-9, Abstract No. 270, 83-95 (1999).
-
(1999)
, pp. 83-95
-
-
Deligianni, H.1
Dukovic, J.O.2
Walton, E.G.3
Contolini, R.J.4
Reid, J.5
Patton, E.6
-
12
-
-
0003474751
-
-
Second Edition, Cambridge University Press, Cambridge, England
-
W. H. Press, S. A. Teukolsky, W. T. Vetterling, and B. P.Flannery, Numerical Recipes in Fortran: The Art of Scientific Computing, Second Edition, Cambridge University Press, Cambridge, England, 1992.
-
(1992)
Numerical Recipes in Fortran: The Art of Scientific Computing
-
-
Press, W.H.1
Teukolsky, S.A.2
Vetterling, W.T.3
Flannery, B.P.4
-
13
-
-
0036690370
-
"Monte Carlo Simulation of the Electrodeposition of Copper, I: Additive-Free Acidic Sulfate Solution"
-
T. J. Pricer. M. J. Kushner, and R. C. Alkire, "Monte Carlo Simulation of the Electrodeposition of Copper, I: Additive-Free Acidic Sulfate Solution," J. Electrochem. Soc. 149, C396-C405 (2002). T.J. Pricer M. J. Kushner Alkire R.C.
-
(2002)
J. Electrochem. Soc.
, vol.149
-
-
Pricer, T.J.1
Kushner, M.J.2
Alkire, R.C.3
-
14
-
-
1042302790
-
"Coupled Mesoscale-Continuum Simulations of Copper Electrodeposition in a Trench"
-
T. O. Drews, E. G. Webb, D. L. Ma, J. Alameda, R. D.Braatz, and R. C. Alkire, "Coupled Mesoscale-Continuum Simulations of Copper Electrodeposition in a Trench," AIChE J. 50, 226-240 (2004).
-
(2004)
AIChE J.
, vol.50
, pp. 226-240
-
-
Drews, T.O.1
Webb, E.G.2
Ma, D.L.3
Alameda, J.4
Braatz, R.D.5
Alkire, R.C.6
-
15
-
-
0037840547
-
"Evolution of Surface Roughness During Copper Electrodeposition in the Presence of Additives: Comparison of Experiments and Monte Carlo Simulations"
-
T. O. Drews, J. C. Ganley, and R. C. Alkire, "Evolution of Surface Roughness During Copper Electrodeposition in the Presence of Additives: Comparison of Experiments and Monte Carlo Simulations," J. Electrochem. Soc. 150, C325-C334 (2003).
-
(2003)
J. Electrochem. Soc.
, vol.150
-
-
Drews, T.O.1
Ganley, J.C.2
Alkire, R.C.3
-
16
-
-
0034031855
-
"Multiscale Modeling of Hard Materials: Challenges and Opportunities for Chemical Engineering"
-
D. Maroudas, "Multiscale Modeling of Hard Materials: Challenges and Opportunities for Chemical Engineering," AIChE J. 46, 878-882 (2000).
-
(2000)
AIChE J.
, vol.46
, pp. 878-882
-
-
Maroudas, D.1
-
17
-
-
0035441825
-
"Trench Filling by Ionized Metal Physical Vapor Deposition"
-
J. Lu and M. J. Kushner, "Trench Filling by Ionized Metal Physical Vapor Deposition," J. Vac. Sci. Technol. A 19, 2652-2663 (2001).
-
(2001)
J. Vac. Sci. Technol. A
, vol.19
, pp. 2652-2663
-
-
Lu, J.1
Kushner, M.J.2
-
20
-
-
0037417955
-
"Coarse-Grained Stochastic Processes for Microscopic Lattice Systems"
-
M. A. Katsoulakis, A. J. Majda, and D. G. Vlachos, "Coarse-Grained Stochastic Processes for Microscopic Lattice Systems," Proc. Natl. Acad. Sci. USA 100, 782-787 (2003).
-
(2003)
Proc. Natl. Acad. Sci. USA
, vol.100
, pp. 782-787
-
-
Katsoulakis, M.A.1
Majda, A.J.2
Vlachos, D.G.3
-
21
-
-
4243074668
-
"Multiscale Coarse-Grained Kinetic Monte Carlo Simulations of Copper Electrodeposition with Additives"
-
T. O. Drews, R. D. Braatz, and R. C. Alkire, "Multiscale Coarse-Grained Kinetic Monte Carlo Simulations of Copper Electrodeposition with Additives," Int. J. Multiscale Computational Eng. 2, 313-327 (2004).
-
(2004)
Int. J. Multiscale Computational Eng.
, vol.2
, pp. 313-327
-
-
Drews, T.O.1
Braatz, R.D.2
Alkire, R.C.3
-
22
-
-
85039463669
-
"Atomic-Scale Kinetic Monte Carlo Simulations of Copper Nucleation: Investigation of Attachment Limited Rate Laws"
-
Extended Abstracts of the 204th Meeting of the Electrochemical Society, Abstract No. 699
-
T. O. Drews, A. Radisic, J. Erlebacher, R. D. Braatz, P. C.Searson, and R. C. Alkire, "Atomic-Scale Kinetic Monte Carlo Simulations of Copper Nucleation: Investigation of Attachment Limited Rate Laws," Extended Abstracts of the 204th Meeting of the Electrochemical Society, Abstract No. 699 (2003).
-
(2003)
-
-
Drews, T.O.1
Radisic, A.2
Erlebacher, J.3
Braatz, R.D.4
Searson, P.C.5
Alkire, R.C.6
-
23
-
-
0042407342
-
"Kinetics of Surface Growth - Phenomenology, Scaling, and Mechanisms of Smoothening and Roughening"
-
W. M. Tong and R. S. Williams, "Kinetics of Surface Growth - Phenomenology, Scaling, and Mechanisms of Smoothening and Roughening," Annu. Rev. Phys. Chem. 45, 401-438 (1994).
-
(1994)
Annu. Rev. Phys. Chem.
, vol.45
, pp. 401-438
-
-
Tong, W.M.1
Williams, R.S.2
-
24
-
-
85039468756
-
"Parameter Estimation of a Copper Electrodeposition Additive Mechanism Using Data Obtained from a D-Optimal Experimental Design"
-
Extended Abstracts of the 204th Meeting of the Electrochemical Society, Abstract No. 698
-
T. O. Drews, F. Xue, X. Li, H. Deligianni, P. M. Vereecken, E. I. Cooper, P. C. Andricacos, R. D. Braatz, and R. C.Alkire, "Parameter Estimation of a Copper Electrodeposition Additive Mechanism Using Data Obtained from a D-Optimal Experimental Design," Extended Abstracts of the 204th Meeting of the Electrochemical Society, Abstract No. 698 (2003).
-
(2003)
-
-
Drews, T.O.1
Xue, F.2
Li, X.3
Deligianni, H.4
Vereecken, P.M.5
Cooper, E.I.6
Andricacos, P.C.7
Braatz, R.D.8
Alkire, R.C.9
|