Thermal resistance measurement of GaAs MESFETs by means of photocurrent spectrum analysis and comparison with simulations

Semiconductor Science and Technology

Volumn 20, Issue 2, 2005, Pages 135-139

  Regoliosi, Pietro ^a   Di Carlo, Aldo ^a   Reale, Andrea ^a   Lugli, Paolo ^a,c   Peroni, Marco ^b   Lanzieri, Claudio ^b   Cetronio, Antonio ^b  

^a UNIVERSITY OF ROME TOR VERGATA   (Italy)

^b Elettronica SpA   (Italy)

^c TECHNICAL UNIVERSITY OF MUNICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; HEAT RESISTANCE; LIQUID CRYSTALS; PHOTOCURRENTS; RAMAN SPECTROSCOPY; SEMICONDUCTING GALLIUM; SPECTRUM ANALYSIS; THERMAL CONDUCTIVITY;

CHANNEL TEMPERATURE; HYDRODYNAMIC SIMULATIONS; PHOTOCURRENT SPECTRUM; SIMULATION TECHNIQUES;

MESFET DEVICES;

EID: 13644281996     PISSN: 02681242     EISSN: None     Source Type: Journal    
DOI: 10.1088/0268-1242/20/2/005     Document Type: Article

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