Imaging using lateral bending modes of atomic force microscope cantilevers

Applied Physics Letters

Volumn 85, Issue 26, 2004, Pages 6398-6400

  Caron, A ^a   Rabe, U ^a   Reinstadtler M ^a   Turner, J A ^b   Arnold, W ^a  

^a SAARLAND UNIVERSITY   (Germany)

^b UNIVERSITY OF NEBRASKA LINCOLN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

IMAGE VARIATIONS; OPTICAL BEAM-DEFLECTION; SCANNIG INTERFEROMETERS; SCANNING PROBE TECHNIQUES;

ATOMIC FORCE MICROSCOPY; BENDING STRENGTH; BUCKLING; CANTILEVER BEAMS; FINITE ELEMENT METHOD; FRICTION; SHEAR STRENGTH; STIFFNESS; TORSIONAL STRESS;

IMAGING TECHNIQUES;

EID: 13444311826     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1833553     Document Type: Article

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