Stress measurements in nanocrystalline Ni electrodeposits

Journal of Alloys and Compounds

Volumn 389, Issue 1-2, 2005, Pages 140-143

  El Sherik, A M ^a   Shirokoff, J ^b   Erb, U ^c  

^a DOFASCO INC   (Canada)

^b MEMORIAL UNIVERSITY OF NEWFOUNDLAND   (Canada)

^c UNIVERSITY OF TORONTO   (Canada)

Author keywords

Electrodeposition; Nanocrystalline coatings; X ray diffraction

Indexed keywords

COATINGS; COMPRESSIVE STRESS; CONDENSATION; CORROSION RESISTANCE; ELASTIC MODULI; ELECTRODEPOSITION; ELECTROPLATING; ERROR ANALYSIS; GRAIN SIZE AND SHAPE; NANOSTRUCTURED MATERIALS; POISSON RATIO; RESIDUAL STRESSES; STRENGTH OF MATERIALS; TENSILE STRESS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION;

ELECTRON MICROGRAPHS; NANOCRYSTALLINE COATINGS; STRESS MEASUREMENTS; X-RAY LINE BROADENING;

NICKEL;

EID: 13444306579     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2004.08.010     Document Type: Article

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