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Volumn 174, Issue 1-4, 1997, Pages 501-505
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Stress and microstructure of nanocrystalline FeXN (X = Ta, Si, and Al) thin films
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Author keywords
FeAlN; FeSiN; FeTaN; Thin film stress; Thin films
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Indexed keywords
COMPOSITION EFFECTS;
CRYSTAL GROWTH;
CRYSTAL STRUCTURE;
IRON ALLOYS;
MAGNETIC ANISOTROPY;
MAGNETIC DOMAINS;
MAGNETIC THIN FILMS;
NITRIDES;
STRESS CONCENTRATION;
BIAXIAL MODULUS;
IRON ALUMINUM NITRIDE;
IRON SILICON NITRIDE;
IRON TANTALUM NITRIDE;
MAGNETOELASTIC ANISOTROPY;
NANOSTRUCTURED MATERIALS;
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EID: 0031547240
PISSN: 00220248
EISSN: None
Source Type: Journal
DOI: 10.1016/S0022-0248(96)01149-9 Document Type: Article |
Times cited : (4)
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References (18)
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