![]() |
Volumn 242, Issue 3-4, 2005, Pages 375-379
|
Ion bombardment induced interface broadening in Co/Cu system as a function of layer thickness
|
Author keywords
AES depth profiling; Co Cu system; Ion bombardment induced interface broadening; Thin film analysis; TRIM simulation
|
Indexed keywords
COBALT;
COPPER;
MORPHOLOGY;
POLYCRYSTALLINE MATERIALS;
SPUTTERING;
SURFACE ROUGHNESS;
THIN FILMS;
ES DEPTH PROFILING;
ION-SOLID INTERACTION;
THIN FILM ANALYSIS;
TRIM SIMULATION;
ION BOMBARDMENT;
|
EID: 13444301319
PISSN: 01694332
EISSN: None
Source Type: Journal
DOI: 10.1016/j.apsusc.2004.09.002 Document Type: Article |
Times cited : (7)
|
References (16)
|