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Volumn 242, Issue 3-4, 2005, Pages 375-379

Ion bombardment induced interface broadening in Co/Cu system as a function of layer thickness

Author keywords

AES depth profiling; Co Cu system; Ion bombardment induced interface broadening; Thin film analysis; TRIM simulation

Indexed keywords

COBALT; COPPER; MORPHOLOGY; POLYCRYSTALLINE MATERIALS; SPUTTERING; SURFACE ROUGHNESS; THIN FILMS;

EID: 13444301319     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2004.09.002     Document Type: Article
Times cited : (7)

References (16)
  • 10
    • 13444304934 scopus 로고    scopus 로고
    • TELETWIN ion gun is the product of Technoorg Linda (Budapest), patent No. PCT/HU96/00054
    • TELETWIN ion gun is the product of Technoorg Linda (Budapest), patent No. PCT/HU96/00054.
  • 13
    • 13444257091 scopus 로고    scopus 로고
    • W. Möller, M. Posselt, Forschungzentrum Rossendorf, 01314 Dresden, Germany, TRIDYN_FZR, FZR-317
    • W. Möller, M. Posselt, Forschungzentrum Rossendorf, 01314 Dresden, Germany, TRIDYN_FZR, FZR-317.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.