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Volumn 2, Issue , 2001, Pages 941-944

A new flash memory sense amplifier in 0.18μm CMOS technology

Author keywords

[No Author keywords available]

Indexed keywords

AREA EFFICIENCY; BIT LINES; BITLINE CAPACITANCE; CMOS TECHNOLOGY; CURRENT SENSING; DELAY TIME; FAST RESPONSE; HIGH TEMPERATURE SIMULATIONS; LAYOUT DESIGNS; OPERATING CONDITION; PRE-CHARGE; READ OPERATION; SENSE AMPLIFIER; SENSING SCHEMES; SILICON AREA; SIMULATION RESULT; WORST CASE;

EID: 13444296772     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (2)

References (7)
  • 2
    • 0020113468 scopus 로고    scopus 로고
    • An n-well CMOS dynamic RAM
    • K. Shimohigashi et al, "An n-well CMOS dynamic RAM", IEEE Trans. Electron Devices, vol. ED-29, no. A, pp. 714-718.
    • IEEE Trans. Electron Devices , vol.ED-29 , Issue.A , pp. 714-718
    • Shimohigashi, K.1
  • 3
    • 11644258099 scopus 로고
    • An experimental 4-Mbit CMOS DRAM
    • Oct.
    • T. Furuyama et al, "An experimental 4-Mbit CMOS DRAM", IEEE Journal of solid-state circuits, vol. SC-21, no. 5, pp. 605-611, Oct. 1986.
    • (1986) IEEE Journal of Solid-state Circuits , vol.SC-21 , Issue.5 , pp. 605-611
    • Furuyama, T.1
  • 4
    • 0026142035 scopus 로고
    • A high-speed clamped bit-line current-mode sense amplifier
    • April
    • Travis N. Blalock, and Richard C. Jaeger, "A High-Speed Clamped Bit-Line Current-Mode Sense Amplifier", IEEE Journal of Solid-State circuits, vol.26, No.4, April 1991. pp. 542-548.
    • (1991) IEEE Journal of Solid-state Circuits , vol.26 , Issue.4 , pp. 542-548
    • Blalock, T.N.1    Jaeger, R.C.2
  • 6
    • 0033221598 scopus 로고    scopus 로고
    • A 256-Mb multilevel flash memory with 2-MB/s program rate for mass storage applications
    • November
    • Atsushi Nozoe et al, "A 256-Mb Multilevel Flash Memory with 2-MB/s Program Rate for Mass Storage Applications", IEEE Journal of Solid-State circuits, vol.34, No.11, November 1999. pp. 1544-1550.
    • (1999) IEEE Journal of Solid-state Circuits , vol.34 , Issue.11 , pp. 1544-1550
    • Nozoe, A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.