Thickness-related instability of Cu thin films on Ag(1 0 0)

Physica B: Condensed Matter

Volumn 357, Issue 1-2 SPEC. ISS., 2005, Pages 152-158

  Pfeifer, M A ^a   Robach, O ^a   Ocko, B M ^b   Robinson, I K ^a  

^a University of Illinois at Urbana Champaign   (United States)

^b BROOKHAVEN NATIONAL LABORATORY   (United States)

Author keywords

CuAg; Martensitic transformations; Surface buckling

Indexed keywords

BUCKLING; COPPER; CRYSTAL STRUCTURE; CRYSTALLINE MATERIALS; DISLOCATIONS (CRYSTALS); ELECTROPLATING; FILM GROWTH; INTERFACES (MATERIALS); LATTICE CONSTANTS; MARTENSITIC TRANSFORMATIONS; SILVER; SURFACE TENSION; SURFACE TREATMENT; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

CRITICAL THICKNESS; CUAG; SURFACE BUCKLING; THIN FILM STRUCTURE;

METALLIC FILMS;

EID: 13444293253     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physb.2004.11.047     Document Type: Conference Paper

References (6)

1. J.W. Matthews, and A.E. Blakeslee J. Cryst. Growth 27 1974 118
2. R.J. Randler, D.M. Kolb, B.M. Ocko, and I.K. Robinson Surf. Sci. 447 2000 187
3. B.M. Ocko, I.K. Robinson, M. Weinert, R.J. Randler, and D.M. Kolb Phys. Rev. Lett. 83 1999 780
4. R.J. Randler, personal communication.
5. T.B. Massalski (Ed.), Binary Alloy Phase Diagrams, second ed., vol. 1, ASM International, 1990.
6. I.K. Robinson, and D.J. Tweet Rep. Prog. Phys. 55 1992 599