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Volumn 32, Issue 3, 2005, Pages 351-358

SMT solder joint's semi-experimental fatigue model

Author keywords

Fatigue; Random vibration; SMT solder joint

Indexed keywords

AUTOMATION; COSTS; FATIGUE OF MATERIALS; PRINTED CIRCUIT BOARDS; RELIABILITY; SEMICONDUCTOR DEVICES; SURFACE MOUNT TECHNOLOGY; THERMAL CYCLING;

EID: 13444292284     PISSN: 00936413     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mechrescom.2004.03.011     Document Type: Article
Times cited : (35)

References (13)
  • 1
    • 0025448513 scopus 로고
    • Combined vibrational and thermal solder joint fatigue - A generalized strain versus life approach
    • Barker D., Vodzak J., Dasgupta A., et al. Combined vibrational and thermal solder joint fatigue - a generalized strain versus life approach. Journal of Electronic Packaging. 112:1990;129-134
    • (1990) Journal of Electronic Packaging , vol.112 , pp. 129-134
    • Barker, D.1    Vodzak, J.2    Dasgupta, A.3
  • 2
    • 2942700907 scopus 로고    scopus 로고
    • Nonlinear dynamic analysis of surface mount interconnects: Part I - Theory
    • Basaran C., Chandaroy R. Nonlinear dynamic analysis of surface mount interconnects: Part I - Theory. Journal of Electronic Packaging. 119:1997;183-188
    • (1997) Journal of Electronic Packaging , vol.119 , pp. 183-188
    • Basaran, C.1    Chandaroy, R.2
  • 3
    • 0032141340 scopus 로고    scopus 로고
    • Mechanics of Pb40/Sn60 near eutectic solder alloys subjected to vibrations
    • Basaran C., Chandaroy R. Mechanics of Pb40/Sn60 near eutectic solder alloys subjected to vibrations. Applied Mathematical Modeling. 22:1998;601-627
    • (1998) Applied Mathematical Modeling , vol.22 , pp. 601-627
    • Basaran, C.1    Chandaroy, R.2
  • 5
    • 0032318258 scopus 로고    scopus 로고
    • Finite element analysis for solder ball failures in chip scale package
    • Lee T., Lee J., Jung I. Finite element analysis for solder ball failures in chip scale package. Microelectronics Reliability. 38:1998
    • (1998) Microelectronics Reliability , vol.38
    • Lee, T.1    Lee, J.2    Jung, I.3
  • 7
    • 0346390499 scopus 로고    scopus 로고
    • Application of FEM for multiple laminated structure in electronic packaging
    • Oda J., Sakamoto J. Application of FEM for multiple laminated structure in electronic packaging. Finite Elements in Analysis and Design. 30:1998
    • (1998) Finite Elements in Analysis and Design , vol.30
    • Oda, J.1    Sakamoto, J.2
  • 8
    • 0028710559 scopus 로고
    • A finite element study of factors affecting fatigue life of solder joints
    • Paydar N., Tong Y., Akay H.U. A finite element study of factors affecting fatigue life of solder joints. Journal of Electronic Packaging. 116:1994
    • (1994) Journal of Electronic Packaging , vol.116
    • Paydar, N.1    Tong, Y.2    Akay, H.U.3
  • 9
    • 13444258641 scopus 로고
    • Vibration analysis for electronic equipment [M]
    • John Wiley & Sons
    • Steinberg D.S. Vibration analysis for electronic equipment [M]. second ed.:1989;John Wiley & Sons
    • (1989) Second Ed.
    • Steinberg, D.S.1
  • 12
    • 0034158821 scopus 로고    scopus 로고
    • Thermomechanical behavior of micron scale solder joints under dynamic loads
    • Zhao Y., Basaran C., Cartwright A., Dishough T. Thermomechanical behavior of micron scale solder joints under dynamic loads. Mechanics of Materials. 32(3):2000;161-173
    • (2000) Mechanics of Materials , vol.32 , Issue.3 , pp. 161-173
    • Zhao, Y.1    Basaran, C.2    Cartwright, A.3    Dishough, T.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.