Recent progress in integrated waveguides based on oxidized porous silicon

Optical Materials

Volumn 27, Issue 5, 2005, Pages 776-780

  Balucani, M ^a   Bondarenko, V ^b   Klusko, A ^b   Ferrari, A ^a  

^a SAPIENZA UNIVERSITY OF ROME   (Italy)

^b BELARUSIAN STATE UNIVERSITY OF INFORMATICS AND RADIOELECTRONICS   (Belarus)

Author keywords

Integrated waveguides; Optical losses; Porous silicon; Swirl defects

Indexed keywords

ATTENUATION; CLADDING (COATING); ETHYLENE; GLYCOLS; ION EXCHANGE; LIGHT ABSORPTION; OXIDATION; POROSITY; THICKNESS MEASUREMENT; TOPOLOGY; WAVEGUIDES;

INTEGRATED WAVEGUIDES; OPTICAL LOSSES; SWIRL DEFECTS; THERMAL OXIDATION;

POROUS SILICON;

EID: 13444278960     PISSN: 09253467     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.optmat.2004.08.014     Document Type: Conference Paper

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