|
|
Volumn 475, Issue 1-2 SPEC. ISS., 2005, Pages 166-170
|
|
Characterization of BLT thin films using MgO buffer layer for MFIS-FET
a
a
a
a
|
|
Author keywords
BLT; Memory window; MFIS; MGO
|
|
Indexed keywords
ACETIC ACID;
BISMUTH COMPOUNDS;
ELECTRIC IMPEDANCE;
ELECTRIC POTENTIAL;
FERROELECTRIC MATERIALS;
FIELD EFFECT TRANSISTORS;
INTERFACES (MATERIALS);
MAGNESIUM COMPOUNDS;
PERMITTIVITY;
PEROVSKITE;
POLARIZATION;
SILICA;
SPUTTERING;
THERMAL EFFECTS;
TRANSMISSION ELECTRON MICROSCOPY;
X RAY DIFFRACTION;
BLT;
BUFFER LAYERS;
MEMORY WINDOW;
MFIS;
THIN FILMS;
|
|
EID: 13444262143
PISSN: 00406090
EISSN: None
Source Type: Journal
DOI: 10.1016/j.tsf.2004.08.029 Document Type: Conference Paper |
|
Times cited : (10)
|
|
References (10)
|
