Results from beam tests of large area silicon drift detectors

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 539, Issue 1-2, 2005, Pages 250-261

  Crescio, E ^a   Bondila, M ^b   Cerello, P ^a   Giubellino, P ^a   Kolozhvari, A ^a   Kouchpil, S ^c   Mazza, G ^a   Montano L M ^a,d   Nouais, D ^a   Piano, S ^e   Piemonte, C ^e   Rashevsky, A ^e   Riccati, L ^a   Rivetti, A ^a   Tosello, F ^a   Vacchi, A ^e   Wheadon, R ^a  

^a UNIVERSITY OF TURIN   (Italy)

^b UNIVERSITY OF JYVÄSKYLÄ   (Finland)

^c NPI   (Czech Republic)

^d DEPARTAMENTO DE FÍSICA   (Mexico)

^e SEZIONE DI TRIESTE   (Italy)

Author keywords

Beam test; Resolution; Silicon drift detectors

Indexed keywords

AMPLIFIERS (ELECTRONIC); DATA REDUCTION; ELECTRIC POTENTIAL; MOS DEVICES; SILICON; TELESCOPES; TRANSFER FUNCTIONS; VLSI CIRCUITS;

BEAM TESTS; DOUBLE-TRACK RESOLUTION; INNER TRACKING SYSTEM (ITS); SILICON DRIFT DETECTORS;

NEUTRON DETECTORS;

EID: 13444261100     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2004.10.006     Document Type: Article

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