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Volumn 439, Issue 2, 2000, Pages 476-482
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Laboratory and test beam results from a large-area silicon drift detector
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Author keywords
[No Author keywords available]
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Indexed keywords
ELECTRODES;
MICROSTRIP DEVICES;
SILICON SENSORS;
TELESCOPES;
VLSI CIRCUITS;
VOLTAGE DIVIDERS;
SILICON DRIFT DETECTORS;
DRIFT CHAMBERS;
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EID: 0033876872
PISSN: 01689002
EISSN: None
Source Type: Journal
DOI: 10.1016/S0168-9002(99)00836-0 Document Type: Article |
Times cited : (18)
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References (12)
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