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2
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0036984334
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Application of Shack-Hartmann wavefront sensing technology to transmissive optic metrology
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R. R. Rammage, D. R. Neal, R. J. Copland, "Application of Shack-Hartmann wavefront sensing technology to transmissive optic metrology," SPIE 4779-27 (2002).
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(2002)
SPIE
, vol.4779
, Issue.27
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Rammage, R.R.1
Neal, D.R.2
Copland, R.J.3
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3
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84975633740
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Least-squares technique for determining principal plane location and focal length
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J. B. Pernick and B Hyman, "Least-squares technique for determining principal plane location and focal length," Appl. Optics 26(15), pp. 2938-2939 (1987).
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(1987)
Appl. Optics
, vol.26
, Issue.15
, pp. 2938-2939
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-
Pernick, J.B.1
Hyman, B.2
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4
-
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85077782675
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Amplitude and phase beam characterization using a two - Dimensional wavefront sensor
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D. R. Neal, W. J. Alford, and J. K. Gruetzner, "Amplitude and phase beam characterization using a two - dimensional wavefront sensor", SPIE 2870, pp.72-82 (1996).
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(1996)
SPIE
, vol.2870
, pp. 72-82
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Neal, D.R.1
Alford, W.J.2
Gruetzner, J.K.3
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5
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0035760748
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Use of beam parameters in optical component testing
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D. R. Neal, J. K. Gruetzner, D. M. Topa, J. Roller, "Use of beam parameters in optical component testing," SPIE 4451, pp. 394-405 (2001).
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(2001)
SPIE
, vol.4451
, pp. 394-405
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Neal, D.R.1
Gruetzner, J.K.2
Topa, D.M.3
Roller, J.4
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6
-
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79959529568
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Near-and far-field measurements of aero-optical effects due to propagation through hypersonic flows
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W. J. Yanta, W. C. Spring, III, J. F. Lafferty, A. S. Collier, R. L. Bell, D. Neal, D. Hamrick, J. Copland, L. Pezzaniti, M. Banish, R. Shaw, "Near-and far-field measurements of aero-optical effects due to propagation through hypersonic flows," AIAA-2000-2357 (2000).
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(2000)
AIAA-2000-2357
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-
Yanta, W.J.1
Spring III, W.C.2
Lafferty, J.F.3
Collier, A.S.4
Bell, R.L.5
Neal, D.6
Hamrick, D.7
Copland, J.8
Pezzaniti, L.9
Banish, M.10
Shaw, R.11
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7
-
-
84982318967
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Shack-Hartmann wavefront sensor testing of aero-optic phenomenon
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Albuquerque, NM, June
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Neal, D.R., Hedlund, E., Lederer, M., Collier, A., Spring, C., Yanta, W., "Shack-Hartmann Wavefront Sensor Testing of Aero-optic Phenomenon," AIAA 98-2701, 20th AIAA Advanced Measurement and Ground Testing Technology Conference, Albuquerque, NM, June 1998.
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(1998)
AIAA 98-2701, 20th AIAA Advanced Measurement and Ground Testing Technology Conference
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Neal, D.R.1
Hedlund, E.2
Lederer, M.3
Collier, A.4
Spring, C.5
Yanta, W.6
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8
-
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0027849974
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Wavefront sensors for optical diagnostics in fluid mechanics: Applications to heated flows, turbulence and droplet evaporation
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Neal, D.R., O'Hern., Torczynski, J.R., Warren, M.E. and Shul, R., "Wavefront Sensors for Optical Diagnostics in Fluid Mechanics: Applications to Heated Flows, Turbulence and Droplet Evaporation," from Optical Diagnostics in Fluid and Thermal Flows, SPIE 2005, 1993.
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(1993)
Optical Diagnostics in Fluid and Thermal Flows, SPIE
, vol.2005
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Neal, D.R.1
O'Hern2
Torczynski, J.R.3
Warren, M.E.4
Shul, R.5
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10
-
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0034864479
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The effect of lenslet resolution on the accuracy of ocular wavefront measurements
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D. R. Neal, D. M. Topa, and James Copland "The effect of lenslet resolution on the accuracy of ocular wavefront measurements," SPIE 4245 (2001).
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(2001)
SPIE
, pp. 4245
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Neal, D.R.1
Topa, D.M.2
Copland, J.3
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11
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0036983807
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High-speed, non-interferometric nanotopographic characterization of Si wafer surfaces
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T.D. Raymond, D.R. Neal, D.M. Topa, and T.L. Schmitz, "High-speed, non-interferometric nanotopographic characterization of Si wafer surfaces," SPIE 4809-34, 2002.
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(2002)
SPIE
, vol.4809
, Issue.34
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Raymond, T.D.1
Neal, D.R.2
Topa, D.M.3
Schmitz, T.L.4
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12
-
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1842583972
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Testing highly aberrated large optics with a Shack-Hartmann wavefront sensor
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D. R. Neal, P. Pulaski, T.D. Raymond, and D. A. Neal, "Testing highly aberrated large optics with a Shack-Hartmann wavefront sensor," SPIE 5162, 2003.
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(2003)
SPIE
, vol.5162
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Neal, D.R.1
Pulaski, P.2
Raymond, T.D.3
Neal, D.A.4
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13
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0003333241
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Wavefront sensors for control and process monitoring in optics manufacture
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D. R. Neal, D. J. Armstrong and W. T. Turner, "Wavefront sensors for control and process monitoring in optics manufacture," SPIE 2993, pp. 211-220, 1997.
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(1997)
SPIE
, vol.2993
, pp. 211-220
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Neal, D.R.1
Armstrong, D.J.2
Turner, W.T.3
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14
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0034832891
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History and principles of Shack-Hartmann wavefront sensing
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Sept/Oct
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B. Platt, R. Shack, "History and principles of Shack-Hartmann wavefront sensing" Journal of Refractive Surgery, 17 (Sept/Oct 2001).
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(2001)
Journal of Refractive Surgery
, vol.17
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Platt, B.1
Shack, R.2
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15
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0036986438
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Shack-Hartmann wavefront sensor precision and accuracy
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D. R. Neal, J. Copland, D.A. Neal, "Shack-Hartmann wavefront sensor precision and accuracy," SPIE 4779, 2002.
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(2002)
SPIE
, vol.4779
-
-
Neal, D.R.1
Copland, J.2
Neal, D.A.3
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16
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0019045493
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Wave-front estimation from wavefront slope measurements
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August
-
W.H. Southwell "Wave-front estimation from wavefront slope measurements" JOSA 70, pp.993-1006 (August 1980)
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(1980)
JOSA
, vol.70
, pp. 993-1006
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Southwell, W.H.1
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17
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0003877515
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John Wiley & Sons, New York
-
nd Ed., John Wiley & Sons, New York
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nd Ed.
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Malacara, D.1
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