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Journal of Crystal Growth

Volumn 264, Issue 1-3, 2004, Pages 312-315

Properties of Nd-doped Bi4Ti3O12 thin films grown by metalorganic solution decomposition

(7) Yang, Ch H a Wang, Zh a Zhai, J P a Ma, G P a Sun, X Q a Yi, X J a Han, J R a

a SHANDONG UNIVERSITY (China)

Author keywords

A1. Atomic force microscopy; B1. Perovskites; B2. Dielectric materials

Indexed keywords

ATOMIC FORCE MICROSCOPY; BISMUTH COMPOUNDS; CRYSTALLIZATION; DOPING (ADDITIVES); ELECTRIC INSULATION; ELECTRIC RESISTANCE; FILM GROWTH; MORPHOLOGY; NEODYMIUM; ORGANOMETALLICS; PERMITTIVITY; SOLUTIONS; SYNTHESIS (CHEMICAL); THIN FILMS; X RAY DIFFRACTION ANALYSIS;

DISSIPATION FACTOR; METALORGANIC SOLUTION DECOMPOSITION;

CRYSTAL GROWTH;

EID: 1342327966 PISSN: 00220248 EISSN: None Source Type: Journal
DOI: 10.1016/j.jcrysgro.2004.01.002 Document Type: Article

Times cited : (5)

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